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XPS analysis of ZnO:Ga films deposited by magnetron sputtering: Substrate bias effect
F. C. Correia, N. Bundaleski, O. M. N. D. Teodoro, M. R. Correia, L. Rebouta, Adélio Mendes, C. J. Tavares
Research output: Contribution to journal › Article › peer-review
46
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(Scopus)