XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor

Ivana Radisavljević, João Trigueiro, N. Bundaleski, Mirjana Medić, Nebojša Romčević, O. M N D Teodoro, M. Mitrić, Nenad Ivanović

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Local structures and electronic properties of II-VI quaternary Zn0.98Fe0.02Te0.91Se0.09 mixed crystal are studied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation in air are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modification with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and segregation of constituent atomic species at the surface are revealed and possible mechanisms of oxygen adsorption are discussed.

Original languageEnglish
Pages (from-to)17-22
Number of pages6
JournalJournal Of Alloys And Compounds
Volume632
DOIs
Publication statusPublished - 25 May 2015

Keywords

  • Impurities in semiconductors
  • Photoelectron spectroscopies
  • Semiconductors

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