@article{e5e9a0ed125044f1ab84b82e74d9095c,
title = "XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor",
abstract = "Local structures and electronic properties of II-VI quaternary Zn0.98Fe0.02Te0.91Se0.09 mixed crystal are studied by X-ray absorption fine structure (XAFS) while the surface composition and its oxidation in air are studied by X-ray photoelectron spectroscopy (XPS). That way the surface stability and its modification with respect to the bulk are elucidated. The effects of surface oxidation on rearrangement and segregation of constituent atomic species at the surface are revealed and possible mechanisms of oxygen adsorption are discussed.",
keywords = "Impurities in semiconductors, Photoelectron spectroscopies, Semiconductors",
author = "Ivana Radisavljevi{\'c} and Jo{\~a}o Trigueiro and N. Bundaleski and Mirjana Medi{\'c} and Neboj{\v s}a Rom{\v c}evi{\'c} and Teodoro, {O. M N D} and M. Mitri{\'c} and Nenad Ivanovi{\'c}",
note = "Sem PDF. The research leading to these results has received funding from the European Community's Seventh Framework programme (FP7/2007-2013) under the Grant agreement NO 226716 and is supported by Serbian Ministry of Education, Science and Technological Development under the Grant III45003, the Program of scientific and technological cooperation between Republic of Serbia and Republic of Portugal under the Grant No. 451-03-02328/2012-14/03 and the Portuguese Research Grant Pest-OE/FIS/UI0068/2011 through FCT-MEC. HASYLAB @ DESY is acknowledged for providing the beam time for XAFS measurements.",
year = "2015",
month = may,
day = "25",
doi = "10.1016/j.jallcom.2015.01.169",
language = "English",
volume = "632",
pages = "17--22",
journal = "Journal of Alloys and Compounds",
issn = "0925-8388",
publisher = "Elsevier",
}