X-ray-spectroscopy analysis of electron-cyclotron-resonance ion-source plasmas

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Abstract

Analysis of x-ray spectra emitted by highly charged ions in an electron-cyclotron-resonance ion source (ECRIS) may be used as a tool to estimate the charge-state distribution (CSD) in the source plasma. For that purpose, knowledge of the electron energy distribution in the plasma, as well as the most important processes leading to the creation and de-excitation of ionic excited states are needed. In this work we present a method to estimate the ion CSD in an ECRIS through the analysis of the x-ray spectra emitted by the plasma. The method is applied to the analysis of a sulfur ECRIS plasma.
Original languageUnknown
Pages (from-to)062516
JournalPhysical Review A
Volume82
Issue number6
DOIs
Publication statusPublished - 1 Jan 2010

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