X-ray Photoelectron Spectroscopy for Studying Passivation Architectures of Cu(InGa)Se2Cells

Margarida Monteiro, Marco A. Curado, Antonio J. N. Oliveira, Kevin Oliveira, Jennifer P. Teixeira, Wei C. Chen, Marika Edoff, Pedro M. P. Salome, Paulo A. Fernandes, Ana G. Silva

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Optoelectronic devices are susceptible to interface recombination, which can have a detrimental impact on their performance. Therefore, there is an urgent need for tailored passivation strategies to reach a technological boost. In this contribution, two architectures based on passivated Cu(InGa)Se2 solar cells are analyzed with X-ray photoelectron spectroscopy (XPS): one based on rear passivation with gold nanoparticle aggregates, and the other with Al2O3 as a front passivation layer. It is demonstrated that XPS can assist in the understanding of passivated devices from a chemical point of view, comprehend their limitations and push forward the development of future devices.

Original languageEnglish
Title of host publication2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages890-892
Number of pages3
ISBN (Electronic)9781665419222
DOIs
Publication statusPublished - 20 Jun 2021
Event48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States
Duration: 20 Jun 202125 Jun 2021

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISSN (Print)0160-8371

Conference

Conference48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Country/TerritoryUnited States
CityFort Lauderdale
Period20/06/2125/06/21

Keywords

  • Cu(InGa)Se2
  • Passivation Layers
  • X-ray Photoelectron Spectroscopy

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