Very low frequency dielectric relaxation deduced from time domain measurements

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Abstract

A method for analyzing the isothermal charging and discharging currents is proposed. It allows the separation of relaxation processes and the data can be analyzed using a simplified model and/or the Fourier transform. The theoretical expectations are in good agreement with the experimental results if the isothermal current is approximated by a sum of exponential decay functions.
Original languageEnglish
Title of host publicationKEY ENGINEERING MATERIALS
Pages579-582
Number of pages4
Volume230-2
Publication statusPublished - 1 Jan 2002
Event1st International Materials Symposium (Materials 2001) - Universidade de Coimbra, Coimbra, Portugal
Duration: 9 Apr 200111 Apr 2001

Conference

Conference1st International Materials Symposium (Materials 2001)
CountryPortugal
CityCoimbra
Period9/04/0111/04/01

Keywords

  • Time Domain Spectroscopy
  • Very Low Frequency Dispersion
  • Dielectric Relaxation

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