Very low frequency dielectric relaxation deduced from time domain measurements

Eugen Neagu; José Narciso Marat-Mendes; Carlos Jorge Mariano Miranda Dias; Rodica M. Neagu

Very low frequency dielectric relaxation deduced from time domain measurements

Eugen Neagu, José Narciso Marat-Mendes, Carlos Jorge Mariano Miranda Dias, Rodica M. Neagu

DCM - Departamento de Ciência dos Materiais

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A method for analyzing the isothermal charging and discharging currents is proposed. It allows the separation of relaxation processes and the data can be analyzed using a simplified model and/or the Fourier transform. The theoretical expectations are in good agreement with the experimental results if the isothermal current is approximated by a sum of exponential decay functions.

Original language	English
Title of host publication	KEY ENGINEERING MATERIALS
Pages	579-582
Number of pages	4
Volume	230-2
Publication status	Published - 1 Jan 2002
Event	1st International Materials Symposium (Materials 2001) - Universidade de Coimbra, Coimbra, Portugal Duration: 9 Apr 2001 → 11 Apr 2001

Conference

Conference	1st International Materials Symposium (Materials 2001)
Country/Territory	Portugal
City	Coimbra
Period	9/04/01 → 11/04/01

Keywords

Time Domain Spectroscopy
Very Low Frequency Dispersion
Dielectric Relaxation

Cite this

@inproceedings{e0e88e89be9549d2beeffbaf8de0081d,

title = "Very low frequency dielectric relaxation deduced from time domain measurements",

abstract = "A method for analyzing the isothermal charging and discharging currents is proposed. It allows the separation of relaxation processes and the data can be analyzed using a simplified model and/or the Fourier transform. The theoretical expectations are in good agreement with the experimental results if the isothermal current is approximated by a sum of exponential decay functions.",

keywords = "Time Domain Spectroscopy, Very Low Frequency Dispersion, Dielectric Relaxation",

author = "Eugen Neagu and Marat-Mendes, {Jos{\'e} Narciso} and Dias, {Carlos Jorge Mariano Miranda} and Neagu, {Rodica M.}",

year = "2002",

month = jan,

day = "1",

language = "English",

volume = "230-2",

pages = "579--582",

booktitle = "KEY ENGINEERING MATERIALS",

note = "1st International Materials Symposium (Materials 2001) ; Conference date: 09-04-2001 Through 11-04-2001",

}

TY - GEN

T1 - Very low frequency dielectric relaxation deduced from time domain measurements

AU - Neagu, Eugen

AU - Marat-Mendes, José Narciso

AU - Dias, Carlos Jorge Mariano Miranda

AU - Neagu, Rodica M.

PY - 2002/1/1

Y1 - 2002/1/1

N2 - A method for analyzing the isothermal charging and discharging currents is proposed. It allows the separation of relaxation processes and the data can be analyzed using a simplified model and/or the Fourier transform. The theoretical expectations are in good agreement with the experimental results if the isothermal current is approximated by a sum of exponential decay functions.

AB - A method for analyzing the isothermal charging and discharging currents is proposed. It allows the separation of relaxation processes and the data can be analyzed using a simplified model and/or the Fourier transform. The theoretical expectations are in good agreement with the experimental results if the isothermal current is approximated by a sum of exponential decay functions.

KW - Time Domain Spectroscopy

KW - Very Low Frequency Dispersion

KW - Dielectric Relaxation

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-0036429288&origin=resultslist&sort=plf-f&src=s&st1

M3 - Conference contribution

VL - 230-2

SP - 579

EP - 582

BT - KEY ENGINEERING MATERIALS

T2 - 1st International Materials Symposium (Materials 2001)

Y2 - 9 April 2001 through 11 April 2001

ER -

Very low frequency dielectric relaxation deduced from time domain measurements

Abstract

Conference

Keywords

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