True Random Number Generator Implemented in 130 nm CMOS Nanotechnology

Pedro Monteiro; Luís Oliveira; João Casaleiro

doi:10.1109/YEF-ECE55092.2022.9849994

True Random Number Generator Implemented in 130 nm CMOS Nanotechnology

Pedro Monteiro, Luís Oliveira, João Casaleiro

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Random generators systems have the capacity to generate cryptographic keys which, when mixed with the information, hide it in an efficient and timely manner. There are two categories of RNG, being truly random (TRNG) or pseudorandom (PRNG). To study the entropy source based on the noise of an oscillator, and to achieve that, an RNG circuit was designed to have a low power consumption, a high randomness and a low cost and area usage. The chosen architecture for this paper is a hybrid RNG, which uses oscillators and a chaotic circuit to generate the random bits. With the simulation of the circuit, it was found to be at the objectives mark, having a low power consumption of 1.19 mW, a high throughput of 25 Mbit/s and an energy per bit of 47.6 pJ/bit. However, due to limitations with the simulation, it wasn't possible to run all the statistical tests, although all the ran tests were passed.

Original language	English
Title of host publication	Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022
Place of Publication	New York
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	52-56
Number of pages	5
ISBN (Electronic)	978-1-6654-6731-5
ISBN (Print)	978-1-6654-6732-2
DOIs	https://doi.org/10.1109/YEF-ECE55092.2022.9849994
Publication status	Published - 2022
Event	2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022 - Caparica, Lisbon, Portugal Duration: 1 Jul 2022 → 1 Jul 2022

Publication series

Name	Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022
Publisher	IEEE

Conference

Conference	2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022
Country/Territory	Portugal
City	Lisbon
Period	1/07/22 → 1/07/22

Keywords

chaotic
cryptographic
information
oscillator
PRNG
random
TRNG

Access to Document

10.1109/YEF-ECE55092.2022.9849994

Cite this

Monteiro, P., Oliveira, L., & Casaleiro, J. (2022). True Random Number Generator Implemented in 130 nm CMOS Nanotechnology. In Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022 (pp. 52-56). (Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/YEF-ECE55092.2022.9849994

Monteiro, Pedro ; Oliveira, Luís ; Casaleiro, João. / True Random Number Generator Implemented in 130 nm CMOS Nanotechnology. Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022. New York : Institute of Electrical and Electronics Engineers (IEEE), 2022. pp. 52-56 (Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022).

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Monteiro, P , Oliveira, L & Casaleiro, J 2022, True Random Number Generator Implemented in 130 nm CMOS Nanotechnology. in Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022. Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022, Institute of Electrical and Electronics Engineers (IEEE), New York, pp. 52-56, 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022, Lisbon, Portugal, 1/07/22. https://doi.org/10.1109/YEF-ECE55092.2022.9849994

True Random Number Generator Implemented in 130 nm CMOS Nanotechnology. / Monteiro, Pedro ; Oliveira, Luís ; Casaleiro, João.
Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022. New York: Institute of Electrical and Electronics Engineers (IEEE), 2022. p. 52-56 (Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Monteiro P , Oliveira L , Casaleiro J. True Random Number Generator Implemented in 130 nm CMOS Nanotechnology. In Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022. New York: Institute of Electrical and Electronics Engineers (IEEE). 2022. p. 52-56. (Proceedings - 2022 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2022). doi: 10.1109/YEF-ECE55092.2022.9849994

True Random Number Generator Implemented in 130 nm CMOS Nanotechnology

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