This paper analyzes transparent two-TFT current mirrors using a-GIZO TFTs with different mirroring ratios. In order to achieve a high mirroring ratio, the output TFT in the circuit employed a fingered structure layout to minimize area and overlap capacitance. The analysis of the current mirrors is performed in three phases. In the first, a radial basis function based (RBF) model is developed using measured data from fabricated TFTs on the same chip. Then, in the second phase, the RBF model is implemented in Verilog-A that is used to simulate two-TFT current mirrors with different mirroring ratios. The simulations are carried out using Cadence spectre simulator. In the third phase, simulation results are validated with the measured response from the fabricated circuits.
|Title of host publication||IEEE Computer Society|
|Publication status||Published - 1 Jan 2014|
|Event||UKSIM '14 Proceedings of the 2014 UKSim-AMSS 16th International Conference on Computer Modelling and Simulation - |
Duration: 1 Jan 2014 → …
|Conference||UKSIM '14 Proceedings of the 2014 UKSim-AMSS 16th International Conference on Computer Modelling and Simulation|
|Period||1/01/14 → …|