Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures

M. N. Drozdov, Y. N. Drozdov, N. I. Chkhalo, V. N. Polkovnikov, P. A. Yunin, M. V. Chirkin, G. P. Gololobov, D. V. Suvorov, D. J. Fu, V. Pelenovich, A. Tolstogouzov

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