Abstract
The thin film transistor of the stable electrical characteristic can be provided by forming the passivation layer with the compound of the halogen and group 2 elements in manufacturing a thin-film transistor. The thin film transistor and manufacturing method thereof comprise the substrate(21) having the insulating layer(22); the gate(23) formed in the partial region of insulating layer; the gate isolation layer formed on the insulating layer and gate; the channel region(25) formed in the region corresponding to the gate on the gate isolation layer; the source(26a) and drain(26b) contacting the both sides of the channel area; the passivation layer(27) formed on the channel region, including the compound of the halogen and group 2 elements.
Original language | English |
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Patent number | KR20080099084 |
IPC | H01L 29/ 786 A I |
Priority date | 8/05/07 |
Publication status | Published - 12 Nov 2008 |