Thin Film Refractive Index and Thickness

Paulo Lourenço; Manuela Vieira; Alessandro Fantoni

doi:10.1007/978-3-030-45124-0_17

Thin Film Refractive Index and Thickness

Paulo Lourenço, Manuela Vieira, Alessandro Fantoni

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized in the development of integrated circuitry, are applied to both optical circuits and devices. This provides systems that show improved characteristics when compared to their electronic counterparts. Optical systems enable wider bandwidth operation, less power consumption, more immunity to interference and higher cost-efficiency. These features definitely represent a huge improvement in our daily lives when completely embedded in Information and Communications Technologies, replacing a large percentage of contemporaneous electronic based systems. The building blocks of these optical systems consist on waveguides and structures formed by deposited thin films. Two characteristics of utmost importance for these structures are the height and refractive index of the deposited film. In this work and by using a prism coupler, we will be presenting an optical setup and the experimental method that is used to determine both refractive index and thickness of the wave guiding structure.

Original language	English
Title of host publication	Technological Innovation for Life Improvement - 11th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Proceedings
Editors	Luis M. Camarinha-Matos, Nastaran Farhadi, Fábio Lopes, Helena Pereira
Place of Publication	Cham
Publisher	Springer
Pages	179-188
Number of pages	10
ISBN (Electronic)	978-3-030-45124-0
ISBN (Print)	978-3-030-45123-3
DOIs	https://doi.org/10.1007/978-3-030-45124-0_17
Publication status	Published - 2020
Event	11th Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020 - Costa de Caparica, Portugal Duration: 1 Jul 2020 → 3 Jul 2020

Publication series

Name	IFIP Advances in Information and Communication Technology
Publisher	Springer
Volume	577
ISSN (Print)	1868-4238
ISSN (Electronic)	1868-422X

Conference

Conference	11th Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020
Country/Territory	Portugal
City	Costa de Caparica
Period	1/07/20 → 3/07/20

Keywords

Optical setup
Prism coupling
Refractive index and thickness determination method
Thin film

Access to Document

10.1007/978-3-030-45124-0_17

Cite this

Lourenço, P., Vieira, M., & Fantoni, A. (2020). Thin Film Refractive Index and Thickness. In L. M. Camarinha-Matos, N. Farhadi, F. Lopes, & H. Pereira (Eds.), Technological Innovation for Life Improvement - 11th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Proceedings (pp. 179-188). (IFIP Advances in Information and Communication Technology; Vol. 577). Springer. https://doi.org/10.1007/978-3-030-45124-0_17

Lourenço, Paulo ; Vieira, Manuela ; Fantoni, Alessandro. / Thin Film Refractive Index and Thickness. Technological Innovation for Life Improvement - 11th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Proceedings. editor / Luis M. Camarinha-Matos ; Nastaran Farhadi ; Fábio Lopes ; Helena Pereira. Cham : Springer, 2020. pp. 179-188 (IFIP Advances in Information and Communication Technology).

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abstract = "Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized in the development of integrated circuitry, are applied to both optical circuits and devices. This provides systems that show improved characteristics when compared to their electronic counterparts. Optical systems enable wider bandwidth operation, less power consumption, more immunity to interference and higher cost-efficiency. These features definitely represent a huge improvement in our daily lives when completely embedded in Information and Communications Technologies, replacing a large percentage of contemporaneous electronic based systems. The building blocks of these optical systems consist on waveguides and structures formed by deposited thin films. Two characteristics of utmost importance for these structures are the height and refractive index of the deposited film. In this work and by using a prism coupler, we will be presenting an optical setup and the experimental method that is used to determine both refractive index and thickness of the wave guiding structure.",

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Lourenço, P , Vieira, M & Fantoni, A 2020, Thin Film Refractive Index and Thickness. in LM Camarinha-Matos, N Farhadi, F Lopes & H Pereira (eds), Technological Innovation for Life Improvement - 11th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Proceedings. IFIP Advances in Information and Communication Technology, vol. 577, Springer, Cham, pp. 179-188, 11th Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Costa de Caparica, Portugal, 1/07/20. https://doi.org/10.1007/978-3-030-45124-0_17

Thin Film Refractive Index and Thickness. / Lourenço, Paulo ; Vieira, Manuela ; Fantoni, Alessandro.
Technological Innovation for Life Improvement - 11th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Proceedings. ed. / Luis M. Camarinha-Matos; Nastaran Farhadi; Fábio Lopes; Helena Pereira. Cham: Springer, 2020. p. 179-188 (IFIP Advances in Information and Communication Technology; Vol. 577).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized in the development of integrated circuitry, are applied to both optical circuits and devices. This provides systems that show improved characteristics when compared to their electronic counterparts. Optical systems enable wider bandwidth operation, less power consumption, more immunity to interference and higher cost-efficiency. These features definitely represent a huge improvement in our daily lives when completely embedded in Information and Communications Technologies, replacing a large percentage of contemporaneous electronic based systems. The building blocks of these optical systems consist on waveguides and structures formed by deposited thin films. Two characteristics of utmost importance for these structures are the height and refractive index of the deposited film. In this work and by using a prism coupler, we will be presenting an optical setup and the experimental method that is used to determine both refractive index and thickness of the wave guiding structure.

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BT - Technological Innovation for Life Improvement - 11th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Proceedings

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Lourenço P , Vieira M , Fantoni A. Thin Film Refractive Index and Thickness. In Camarinha-Matos LM, Farhadi N, Lopes F, Pereira H, editors, Technological Innovation for Life Improvement - 11th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Proceedings. Cham: Springer. 2020. p. 179-188. (IFIP Advances in Information and Communication Technology). doi: 10.1007/978-3-030-45124-0_17

Thin Film Refractive Index and Thickness

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Keywords

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