Thin Film Refractive Index and Thickness

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized in the development of integrated circuitry, are applied to both optical circuits and devices. This provides systems that show improved characteristics when compared to their electronic counterparts. Optical systems enable wider bandwidth operation, less power consumption, more immunity to interference and higher cost-efficiency. These features definitely represent a huge improvement in our daily lives when completely embedded in Information and Communications Technologies, replacing a large percentage of contemporaneous electronic based systems. The building blocks of these optical systems consist on waveguides and structures formed by deposited thin films. Two characteristics of utmost importance for these structures are the height and refractive index of the deposited film. In this work and by using a prism coupler, we will be presenting an optical setup and the experimental method that is used to determine both refractive index and thickness of the wave guiding structure.

Original languageEnglish
Title of host publicationTechnological Innovation for Life Improvement - 11th IFIP WG 5.5/SOCOLNET Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020, Proceedings
EditorsLuis M. Camarinha-Matos, Nastaran Farhadi, Fábio Lopes, Helena Pereira
Place of PublicationCham
PublisherSpringer
Pages179-188
Number of pages10
ISBN (Electronic)978-3-030-45124-0
ISBN (Print)978-3-030-45123-3
DOIs
Publication statusPublished - 2020
Event11th Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020 - Costa de Caparica, Portugal
Duration: 1 Jul 20203 Jul 2020

Publication series

NameIFIP Advances in Information and Communication Technology
PublisherSpringer
Volume577
ISSN (Print)1868-4238
ISSN (Electronic)1868-422X

Conference

Conference11th Advanced Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2020
CountryPortugal
CityCosta de Caparica
Period1/07/203/07/20

Keywords

  • Optical setup
  • Prism coupling
  • Refractive index and thickness determination method
  • Thin film

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