Thermoelectric properties of V2O5 thin films deposited by thermal evaporation

R. Santos, J. Loureiro, A. Nogueira, Elamurugu Elangovan, J. V. Pinto, J. P. Veiga, T. Busani, E. Fortunato, R. Martins, I. Ferreira

Research output: Contribution to journalArticlepeer-review

76 Citations (Scopus)


a b s t r a c t This work reports the structural, optical, electrical and thermoelectric properties of vanadium pentoxide (V2O5) thin films deposited at room temperature by thermal evaporation on Corning glass substrates. A post-deposition thermal treatment up to 973 K under atmospheric conditions induces the crystallization of the as-deposited amorphous films with an orthorhombic V2O5 phase with grain sizes around 26 nm. As the annealing temperature rises up to 773 K the electrical conductivity increases. The films exhibit thermoelectric properties with a maximum Seebeck coefficient of −218 ?V/K and electrical conductivity of 5.5 (? m)−1. All the films show NIR-Vis optical transmittance above 60% and optical band gap of 2.8 eV.
Original languageEnglish
Pages (from-to)590-594
Number of pages5
JournalApplied Surface Science
Publication statusPublished - 1 Oct 2013


  • Thermal evaporation
  • Thermoelectric properties
  • Thin films
  • Vanadium pentoxide


Dive into the research topics of 'Thermoelectric properties of V2O5 thin films deposited by thermal evaporation'. Together they form a unique fingerprint.

Cite this