Sub-surface defects induced by low energy Ar+ sputtering of silver

M. Duarte Naia, P. M. Gordo, O. M. N. D. Teodoro, A. P. de Lima, A. M. C. Moutinho, R. S. Brusa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Induced defects in silver polycrystalline samples irradiated with 4 keV Ar+ were characterised with slow positron implantation spectroscopy. The implanted gas was found to interact with ion irradiation defects. The evolution of the defects and gas-defect interactions were followed through a multi-step isochronal annealing treatment. Two different defected regions were detected. A region near to the surface, due to a distribution of vacancy-like defects produced by irradiation, and a deeper one due to coalescence of Ar. The deeper defects evolve with thermal treatments and probably produce cavities which are not easily recovered.

Original languageEnglish
Title of host publicationADVANCED MATERIALS FORUM III
EditorsP. M. Vilarinho
PublisherTrans Tech Publications Ltd
Pages1608-1612
Number of pages5
EditionPART 2
ISBN (Print)9780878494026
Publication statusPublished - 1 Dec 2006
Event3rd International Materials Symposium and 12th Portuguese Materials Society Meeting 2005 - Aveiro, Portugal
Duration: 20 Mar 200523 Mar 2005

Publication series

NameMaterials Science Forum
PublisherTrans Tech Publications Ltd
NumberPART 2
Volume514-516
ISSN (Print)0255-5476

Conference

Conference3rd International Materials Symposium and 12th Portuguese Materials Society Meeting 2005
CountryPortugal
CityAveiro
Period20/03/0523/03/05

Keywords

  • Defect interactions
  • Defects
  • Ion irradiation
  • Slow positron

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