TY - JOUR
T1 - Structural characterisation of NiTi thin film shape memory alloys
AU - Fernandes, Francisco M.Braz
AU - Martins, Rui
AU - Teresa Nogueira, M.
AU - Silva, Rui J.C.
AU - Nunes, Patrícia J.
AU - Costa, Daniel
AU - Ferreira, Isabel
AU - Martins, Rodrigo
PY - 2002/4/30
Y1 - 2002/4/30
N2 - Currently, microactuators are being developed using shape memory alloys (SMAs), which allow simple design geometries and provide large work outputs in restricted space. Several techniques have been used to produce NiTi shape memory alloy thin films, but from the practical point of view, only the sputter deposition method has succeeded so far. Vacuum evaporation of NiTi binary alloy entails the potential problem of the evaporation rates of each component not being the same due to differences in vapour pressure. Aiming to study the possible applications of SMAs to microfabrication, NiTi thin films were produced at CENIMAT by sputter and vacuum evaporation using raw materials from different sources. The films were analysed by differential scanning calorimetry (DSC) and X-ray diffraction (XRD) at room temperature, as well as in situ high temperature, in order to characterise the temperature ranges at which the different structural transformations occur.
AB - Currently, microactuators are being developed using shape memory alloys (SMAs), which allow simple design geometries and provide large work outputs in restricted space. Several techniques have been used to produce NiTi shape memory alloy thin films, but from the practical point of view, only the sputter deposition method has succeeded so far. Vacuum evaporation of NiTi binary alloy entails the potential problem of the evaporation rates of each component not being the same due to differences in vapour pressure. Aiming to study the possible applications of SMAs to microfabrication, NiTi thin films were produced at CENIMAT by sputter and vacuum evaporation using raw materials from different sources. The films were analysed by differential scanning calorimetry (DSC) and X-ray diffraction (XRD) at room temperature, as well as in situ high temperature, in order to characterise the temperature ranges at which the different structural transformations occur.
KW - "Smart" materials
KW - Shape memory effect
KW - Thin films
UR - http://www.scopus.com/inward/record.url?scp=0037197289&partnerID=8YFLogxK
U2 - 10.1016/S0924-4247(01)00898-6
DO - 10.1016/S0924-4247(01)00898-6
M3 - Article
SN - 0924-4247
VL - 99
SP - 55
EP - 58
JO - Sensors and Actuators A: Physical
JF - Sensors and Actuators A: Physical
IS - 1-2
ER -