Spectroscopic ellipsometry study of nickel induced crystallization of a-Si

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

The aim of this work is to present a spectroscopic ellipsometry study focused on the annealing time effect on nickel metal induced crystallization of amorphous silicon thin films. For this purpose silicon layers with 80 and 125 nm were used on the top of which a 0.5 nm Ni thick layer was deposited. The ellipsometry simulation using a Bruggemann Effective Medium Approximation shows that films with 80 nm reach a crystalline fraction of 72% after 1 h annealing, appearing to be full crystallized after 2 h. No significant structural improvement is detected for longer annealing times. On the 125 nm samples the crystalline volume fraction after 1 h is only around 7%, requiring 5 h to get a similar crystalline fraction than the one achieved with the thinner film. This means that the time required for full crystallization will be strongly determined by the Si layer thickness. Using a new fitting approach the Ni content within the films was also determined by SE and related to the silicon film thickness.
Original languageEnglish
Pages (from-to)1204-1208
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume352
Issue number9-20
DOIs
Publication statusPublished - 15 Jun 2006

Fingerprint

Dive into the research topics of 'Spectroscopic ellipsometry study of nickel induced crystallization of a-Si'. Together they form a unique fingerprint.

Cite this