Space charge measurements with Kelvin probe force microscopy

Kapil Faliya, Herbert Kliem, Carlos J. Dias

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The understanding of the complexity of the space charge formation and movement inside insulation materials demands a high resolution measurement technique. The Kelvin Probe Force Microscopy (KPFM) can fulfill this demand. The KPFM delivers the data of the locally varying surface potential. They can be differentiated twice together with a reliable statistical approach to overcome the noise problem in the experimental surface potential data. In this way, we get the locally varying space charges according to the Poisson equation. This statistical approach has been tested by comparing the calculated space charge distributions from simulated and measured noisy surface potential data. The formation and the movement of space charges with respect to time under unbiased and biased conditions were investigated.

Original languageEnglish
Article number7962083
Pages (from-to)1913-1922
Number of pages10
JournalIeee Transactions On Dielectrics And Electrical Insulation
Volume24
Issue number3
DOIs
Publication statusPublished - 2017

Keywords

  • AFM
  • Dielectric materials
  • KPFM
  • polyethylene oxide
  • space charge
  • space charge measurement techniques

Fingerprint Dive into the research topics of 'Space charge measurements with Kelvin probe force microscopy'. Together they form a unique fingerprint.

  • Cite this