Abstract
Growth of Ge on Si surface covered by oxygen leads to formation of nano-crystals. In order to study the size effects Photoemission experiments of Synchrotron radiation from the ASTRID ring (ISA) on a beam line equipped with a spherical grating monochromator and a SCIENTA hemispherical spectrometer are performed. Spectra of bulk Si 2p, bulk Ge 3d and valence bands at 38 eV and 130 eV were measured as a function of the thickness of the Si-Ox multilayers. For a detailed evaluation of the spectra the program FitXPS is used. Results of these measurements will be presented.
| Original language | English |
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| Volume | 1 |
| Publication status | Published - 2014 |