Abstract
A novel methodology based on short run control charts was developed to establish simultaneous intra and inter daily control of instrumental blank samples for trace elements analysis through inductively coupled plasma mass spectrometry (ICP-MS). Eleven inorganic trace elements were analyzed, where chromium was selected to illustrate the methodology. The use of joint control charts, both based on the Quesenberry Q-statistics, revealed to be a suitable tool in detecting possible instrument contaminations as well as evaluating IPC-MS stability.
| Original language | English |
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| Title of host publication | XXI IMEKO World Congress "Measurement in Research and Industry" |
| Publisher | IMEKO-International Measurement Federation Secretariat |
| Publication status | Published - 2015 |
| Event | 21st IMEKO World Congress on Measurement in Research and Industry - Prague, Czech Republic Duration: 30 Aug 2015 → 4 Sept 2015 |
Conference
| Conference | 21st IMEKO World Congress on Measurement in Research and Industry |
|---|---|
| Country/Territory | Czech Republic |
| City | Prague |
| Period | 30/08/15 → 4/09/15 |
Keywords
- Contamination
- ICP-MS
- Instrumental blank samples
- Short run control chart
- Trace elements