Short run control charts as an internal quality control tool

Ana Sofia Matos, José Fernando Gomes Requeijo, Inês Coelho, Sandra Gueifão, Isabel Castanheiro

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

A novel methodology based on short run control charts was developed to establish simultaneous intra and inter daily control of instrumental blank samples for trace elements analysis through inductively coupled plasma mass spectrometry (ICP-MS). Eleven inorganic trace elements were analyzed, where chromium was selected to illustrate the methodology. The use of joint control charts, both based on the Quesenberry Q-statistics, revealed to be a suitable tool in detecting possible instrument contaminations as well as evaluating IPC-MS stability.

Original languageEnglish
Title of host publicationXXI IMEKO World Congress "Measurement in Research and Industry"
PublisherIMEKO-International Measurement Federation Secretariat
Publication statusPublished - 2015
Event21st IMEKO World Congress on Measurement in Research and Industry - Prague, Czech Republic
Duration: 30 Aug 20154 Sep 2015

Conference

Conference21st IMEKO World Congress on Measurement in Research and Industry
CountryCzech Republic
CityPrague
Period30/08/154/09/15

Keywords

  • Contamination
  • ICP-MS
  • Instrumental blank samples
  • Short run control chart
  • Trace elements

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