TY - JOUR
T1 - Role of order and disorder in covalent semiconductors and ionic oxides used to produce thin film transistors
AU - Fortunato, Elvira Maria Correia
AU - Ferreira, Isabel Maria Mercês
AU - Barquinha, Pedro Miguel Cândido
AU - Martins, Rodrigo Ferrão de Paiva
AU - Pereira, Luis Miguel Nunes
PY - 2007/1/1
Y1 - 2007/1/1
N2 - This paper aims to discuss the effect of order and disorder on the electrical performances of covalent silicon semiconductors and ZnO based ionic oxide semiconductors used as active channel layers in thin film transistors. The effect of disorder on covalent semiconductors directly affects their electrical transport properties due to the asymmetric behaviour of sp states, while in ionic oxide semiconductors it is found that this effect is small due to the fact that angular disorder has no effect on the spherical symmetry of s states. To this we must add that the mobility of carriers in both systems is quite different, being also affected by electron-phonon interactions (weak in silicon and strong in ionic oxides leading to formation of polarons). Besides, the impurity doping effect and the presence of vacancies in disordered silicon and in ionic oxides behave differently, which will influence the thin film properties and so, the performances of the devices produced.
AB - This paper aims to discuss the effect of order and disorder on the electrical performances of covalent silicon semiconductors and ZnO based ionic oxide semiconductors used as active channel layers in thin film transistors. The effect of disorder on covalent semiconductors directly affects their electrical transport properties due to the asymmetric behaviour of sp states, while in ionic oxide semiconductors it is found that this effect is small due to the fact that angular disorder has no effect on the spherical symmetry of s states. To this we must add that the mobility of carriers in both systems is quite different, being also affected by electron-phonon interactions (weak in silicon and strong in ionic oxides leading to formation of polarons). Besides, the impurity doping effect and the presence of vacancies in disordered silicon and in ionic oxides behave differently, which will influence the thin film properties and so, the performances of the devices produced.
KW - room-temperature
KW - electrical-properties
KW - silicon
KW - performance
KW - zno
KW - transport
KW - grain-boundaries
KW - stability
U2 - 10.1007/s00339-007-4038-1
DO - 10.1007/s00339-007-4038-1
M3 - Article
SN - 0947-8396
VL - 89
SP - 37
EP - 42
JO - Applied Physics A: Materials Science & Processing
JF - Applied Physics A: Materials Science & Processing
IS - 1
ER -