Residual Self-Interference Estimation in In-Band Full-Duplex Wireless Systems

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Abstract

In this paper, we present a novel method to estimate the distribution of the residual self-interference (SI) power of an in-band Full-duplex (IBFDX) system. Considering the residual SI distribution caused by the uncanceled SI in a post-mixer scheme due to a single propagation tap, we propose a framework capable of estimating the residual SI distribution. The estimator relies on the computation of two estimated parameters, which takes advantage of using the method of moments of the residual SI distribution in a straightforward manner. Additionally, we assess the accuracy of the proposed estimators, considering different sample set lengths adopted in the estimation process. The results testify the quality of the estimation method and its ability to achieve high accuracy, even for a reduced number of samples. This work is of practical importance, particularly when the residual self-interference is mainly due to a line-of-sight component, where the proposed technique can use a small set of samples to predict the residual interference in an accurate way.

Original languageEnglish
Title of host publication2020 International Wireless Communications and Mobile Computing (IWCMC)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1130-1134
Number of pages5
ISBN (Electronic)978-1-7281-3129-0
ISBN (Print)978-1-7281-3130-6
DOIs
Publication statusPublished - Jun 2020
Event16th IEEE International Wireless Communications and Mobile Computing Conference, IWCMC 2020 - Limassol, Cyprus
Duration: 15 Jun 202019 Jun 2020

Publication series

NameInternational Wireless Communications and Mobile Computing Conference, IWCMC
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
ISSN (Print)2376-6492
ISSN (Electronic)2376-6506

Conference

Conference16th IEEE International Wireless Communications and Mobile Computing Conference, IWCMC 2020
Country/TerritoryCyprus
CityLimassol
Period15/06/2019/06/20

Keywords

  • estimation
  • In-band full-duplex
  • performance evaluation
  • residual self-interference

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