@inproceedings{d8e08375151c41aeb01155b621ce0559,
title = "Randomized sample size F tests for the one-way layout",
abstract = "Distributions and densities for F test statistics are obtained assuming random sample sizes, thus getting random degrees of freedom and non-centrality parameters. Classical optimum properties are extended to this new setup as well as Scheff{\'e} Theorem for simultaneous confidence intervals.",
keywords = "F tests, optimum properties, Random sample sizes, simultaneous confidence intervals",
author = "Mexia, {Jo{\~a}o T.} and Moreira, {Elsa E.}",
year = "2010",
month = dec,
day = "1",
doi = "10.1063/1.3497917",
language = "English",
isbn = "978-0-7354-0834-0",
volume = "I-III",
series = "AIP Conference Proceedings",
publisher = "AIP - American Institute of Physics",
pages = "1248--1251",
editor = "G. Psihoyios and C. Tsitouras",
booktitle = "NUMERICAL ANALYSIS AND APPLIED MATHEMATICS, VOLS I-III",
address = "United States",
note = "International Conference on Numerical Analysis and Applied Mathematics 2010, ICNAAM-2010 ; Conference date: 19-09-2010 Through 25-09-2010",
}