Randomized sample size F tests for the one-way layout

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)
2 Downloads (Pure)

Abstract

Distributions and densities for F test statistics are obtained assuming random sample sizes, thus getting random degrees of freedom and non-centrality parameters. Classical optimum properties are extended to this new setup as well as Scheffé Theorem for simultaneous confidence intervals.

Original languageEnglish
Title of host publicationNUMERICAL ANALYSIS AND APPLIED MATHEMATICS, VOLS I-III
EditorsG. Psihoyios, C. Tsitouras
PublisherAmerican Institute of Physics Inc.
Pages1248-1251
Number of pages4
VolumeI-III
ISBN (Print)978-0-7354-0834-0
DOIs
Publication statusPublished - 1 Dec 2010
EventInternational Conference on Numerical Analysis and Applied Mathematics 2010, ICNAAM-2010 - Rhodes, Greece
Duration: 19 Sep 201025 Sep 2010

Publication series

NameAIP Conference Proceedings
PublisherAmerican Institute of Physics Inc.
Volume1281
ISSN (Print)0094-243X

Conference

ConferenceInternational Conference on Numerical Analysis and Applied Mathematics 2010, ICNAAM-2010
CountryGreece
CityRhodes
Period19/09/1025/09/10

Keywords

  • F tests
  • optimum properties
  • Random sample sizes
  • simultaneous confidence intervals

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  • Cite this

    Mexia, J. T., & Moreira, E. E. (2010). Randomized sample size F tests for the one-way layout. In G. Psihoyios, & C. Tsitouras (Eds.), NUMERICAL ANALYSIS AND APPLIED MATHEMATICS, VOLS I-III (Vol. I-III, pp. 1248-1251). (AIP Conference Proceedings; Vol. 1281). American Institute of Physics Inc.. https://doi.org/10.1063/1.3497917