Progress on precision measurements of inner shell transitions in highly charged ions at an ECR ion source

Csilla I. Szabo, Paul Indelicato, Eric Olivier LeBigot, Alexandre Vallette, Pedro Amaro, Mauro Guerra, Alex Gumberidze

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

Inner shell transitions of highly charged ions produced in the plasma of an Electron Cyclotron Resonance Ion Source (ECRIS) [1] were observed the first time by a Double Crystal Spectrometer (DCS). The DCS is a well-used tool in precision x-ray spectroscopy due to its ability of precision wavelength measurement traced back to a relative angle measurement. Because of its requirement for a bright x-ray source the DCS has not been used before in direct measurements of highly charged ions (HCI). Our new precision measurement of inner shell transitions in HCI is not just going to provide new x-ray standards for quantum metrology but can also give information about the plasma in which the ions reside. Ionic temperatures and with that the electron density can be determined by thorough examination of line widths measured with great accuracy.

Original languageEnglish
Title of host publication17th International Conference on Atomic Processes in Plasmas, ICAPiP
EditorsK. Aggarwal, F. Shearer
PublisherAmerican Institute of Physics
Pages236-239
Number of pages4
ISBN (Print)9780735410299
DOIs
Publication statusPublished - 25 Jun 2012
Event17th International Conference on Atomic Processes in Plasmas, ICAPiP 2011 - Belfast, United Kingdom
Duration: 19 Jul 201222 Jul 2012

Publication series

NameAIP Conference Proceedings
PublisherAmerican Institute of Physics
Volume1438
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference17th International Conference on Atomic Processes in Plasmas, ICAPiP 2011
CountryUnited Kingdom
CityBelfast
Period19/07/1222/07/12

Keywords

  • Double Crystal Spectrometer
  • ECR Ion Source
  • Precision x-ray spectroscopy

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