Power transistor fault diagnosis in SRM drives based on indexes of symmetry

Tito G. Amaral, V. Fernão Pires, A. J. Pires, J. F. Martins, Hao Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

To reduce the negative impacts of power converters on a machine such as switched reluctance motor (SRM) a fast and accurate fault detection method is required. Several fault types could occur in SRM drives, such as, open and short-circuit transistor faults. Thus, this paper presents a new fault detection and diagnosis method for transistor faults in a SRM drive. The method is based on symmetry indexes that are created from the analysis of the currents patterns. The proposed approach results in a fast and robust method, presenting immunity to different mechanical conditions. The characteristics of the proposed method will be verified through several simulation tests.

Original languageEnglish
Title of host publication2018 16th Biennial Baltic Electronics Conference, BEC 2018
PublisherIEEE Computer Society
ISBN (Electronic)9781538673126
DOIs
Publication statusPublished - 3 Jan 2019
Event16th Biennial Baltic Electronics Conference, BEC 2018 - Tallinn, Estonia
Duration: 8 Oct 201810 Oct 2018

Publication series

NameProceedings of the Biennial Baltic Electronics Conference
PublisherIEEE Computer Society
Volume2018-October
ISSN (Print)1736-3705

Conference

Conference16th Biennial Baltic Electronics Conference, BEC 2018
CountryEstonia
CityTallinn
Period8/10/1810/10/18

Keywords

  • fault detection
  • open switch
  • switched reluctance motor (SRM)
  • symmetry indexes

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  • Cite this

    Amaral, T. G., Pires, V. F., Pires, A. J., Martins, J. F., & Chen, H. (2019). Power transistor fault diagnosis in SRM drives based on indexes of symmetry. In 2018 16th Biennial Baltic Electronics Conference, BEC 2018 [8600966] (Proceedings of the Biennial Baltic Electronics Conference; Vol. 2018-October). IEEE Computer Society. https://doi.org/10.1109/BEC.2018.8600966