TY - GEN
T1 - Power transistor fault diagnosis in SRM drives based on indexes of symmetry
AU - Amaral, Tito G.
AU - Pires, V. Fernão
AU - Pires, A. J.
AU - Martins, J. F.
AU - Chen, Hao
N1 - info:eu-repo/grantAgreement/FCT/5876/147282/PT#
info:eu-repo/grantAgreement/FCT/5876/147324/PT#
Pest-E/EEI/LA0021/2014.
FCT/MOST Proc. 441.
Intergovernmental Science and Technology Innovation Cooperation Special Project of National Key R&D Program of China under 2016YFE0132300.
PY - 2019/1/3
Y1 - 2019/1/3
N2 - To reduce the negative impacts of power converters on a machine such as switched reluctance motor (SRM) a fast and accurate fault detection method is required. Several fault types could occur in SRM drives, such as, open and short-circuit transistor faults. Thus, this paper presents a new fault detection and diagnosis method for transistor faults in a SRM drive. The method is based on symmetry indexes that are created from the analysis of the currents patterns. The proposed approach results in a fast and robust method, presenting immunity to different mechanical conditions. The characteristics of the proposed method will be verified through several simulation tests.
AB - To reduce the negative impacts of power converters on a machine such as switched reluctance motor (SRM) a fast and accurate fault detection method is required. Several fault types could occur in SRM drives, such as, open and short-circuit transistor faults. Thus, this paper presents a new fault detection and diagnosis method for transistor faults in a SRM drive. The method is based on symmetry indexes that are created from the analysis of the currents patterns. The proposed approach results in a fast and robust method, presenting immunity to different mechanical conditions. The characteristics of the proposed method will be verified through several simulation tests.
KW - fault detection
KW - open switch
KW - switched reluctance motor (SRM)
KW - symmetry indexes
UR - http://www.scopus.com/inward/record.url?scp=85061479720&partnerID=8YFLogxK
U2 - 10.1109/BEC.2018.8600966
DO - 10.1109/BEC.2018.8600966
M3 - Conference contribution
AN - SCOPUS:85061479720
T3 - Proceedings of the Biennial Baltic Electronics Conference
BT - 2018 16th Biennial Baltic Electronics Conference, BEC 2018
PB - IEEE Computer Society
T2 - 16th Biennial Baltic Electronics Conference, BEC 2018
Y2 - 8 October 2018 through 10 October 2018
ER -