Power transistor fault diagnosis in SRM drives based on indexes of symmetry

Tito G. Amaral; V. Fernão Pires; A. J. Pires; J. F. Martins; Hao Chen

doi:10.1109/BEC.2018.8600966

Power transistor fault diagnosis in SRM drives based on indexes of symmetry

Tito G. Amaral, V. Fernão Pires, A. J. Pires, J. F. Martins, Hao Chen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Abstract

To reduce the negative impacts of power converters on a machine such as switched reluctance motor (SRM) a fast and accurate fault detection method is required. Several fault types could occur in SRM drives, such as, open and short-circuit transistor faults. Thus, this paper presents a new fault detection and diagnosis method for transistor faults in a SRM drive. The method is based on symmetry indexes that are created from the analysis of the currents patterns. The proposed approach results in a fast and robust method, presenting immunity to different mechanical conditions. The characteristics of the proposed method will be verified through several simulation tests.

Original language	English
Title of host publication	2018 16th Biennial Baltic Electronics Conference, BEC 2018
Publisher	IEEE Computer Society
ISBN (Electronic)	9781538673126
DOIs	https://doi.org/10.1109/BEC.2018.8600966
Publication status	Published - 3 Jan 2019
Event	16th Biennial Baltic Electronics Conference, BEC 2018 - Tallinn, Estonia Duration: 8 Oct 2018 → 10 Oct 2018

Publication series

Name	Proceedings of the Biennial Baltic Electronics Conference
Publisher	IEEE Computer Society
Volume	2018-October
ISSN (Print)	1736-3705

Conference

Conference	16th Biennial Baltic Electronics Conference, BEC 2018
Country	Estonia
City	Tallinn
Period	8/10/18 → 10/10/18

Keywords

fault detection
open switch
switched reluctance motor (SRM)
symmetry indexes

Access to Document

10.1109/BEC.2018.8600966

BEC_avarias_final

Link to publication in Scopus

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Amaral, T. G., Pires, V. F., Pires, A. J., Martins, J. F., & Chen, H. (2019). Power transistor fault diagnosis in SRM drives based on indexes of symmetry. In 2018 16th Biennial Baltic Electronics Conference, BEC 2018 [8600966] (Proceedings of the Biennial Baltic Electronics Conference; Vol. 2018-October). IEEE Computer Society. https://doi.org/10.1109/BEC.2018.8600966

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title = "Power transistor fault diagnosis in SRM drives based on indexes of symmetry",

abstract = "To reduce the negative impacts of power converters on a machine such as switched reluctance motor (SRM) a fast and accurate fault detection method is required. Several fault types could occur in SRM drives, such as, open and short-circuit transistor faults. Thus, this paper presents a new fault detection and diagnosis method for transistor faults in a SRM drive. The method is based on symmetry indexes that are created from the analysis of the currents patterns. The proposed approach results in a fast and robust method, presenting immunity to different mechanical conditions. The characteristics of the proposed method will be verified through several simulation tests.",

keywords = "fault detection, open switch, switched reluctance motor (SRM), symmetry indexes",

author = "Amaral, {Tito G.} and Pires, {V. Fern{\~a}o} and Pires, {A. J.} and Martins, {J. F.} and Hao Chen",

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Amaral, TG, Pires, VF, Pires, AJ, Martins, JF & Chen, H 2019, Power transistor fault diagnosis in SRM drives based on indexes of symmetry. in 2018 16th Biennial Baltic Electronics Conference, BEC 2018., 8600966, Proceedings of the Biennial Baltic Electronics Conference, vol. 2018-October, IEEE Computer Society, 16th Biennial Baltic Electronics Conference, BEC 2018, Tallinn, Estonia, 8/10/18. https://doi.org/10.1109/BEC.2018.8600966

Power transistor fault diagnosis in SRM drives based on indexes of symmetry. / Amaral, Tito G.; Pires, V. Fernão; Pires, A. J.; Martins, J. F.; Chen, Hao.

2018 16th Biennial Baltic Electronics Conference, BEC 2018. IEEE Computer Society, 2019. 8600966 (Proceedings of the Biennial Baltic Electronics Conference; Vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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