Poly-Si thin film transistors: Effect of metal thickness on silicon crystallization

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMaterials Science Forum - Advanced Materials Forum III
Pages28-32
Number of pages5
Volume514-516
Publication statusPublished - 1 Jan 2006
EventMateriais 2005 -
Duration: 1 Jan 2005 → …

Conference

ConferenceMateriais 2005
Period1/01/05 → …

Cite this

@inproceedings{de8a2ae6eac141f592809dc59aa1d721,
title = "Poly-Si thin film transistors: Effect of metal thickness on silicon crystallization",
author = "Pereira, {Luis Miguel Nunes} and Barquinha, {Pedro Miguel C{\^a}ndido} and Fortunato, {Elvira Maria Correia} and Martins, {Rodrigo Ferr{\~a}o de Paiva}",
year = "2006",
month = "1",
day = "1",
language = "English",
volume = "514-516",
pages = "28--32",
booktitle = "Materials Science Forum - Advanced Materials Forum III",

}

Pereira, LMN, Barquinha, PMC, Fortunato, EMC & Martins, RFDP 2006, Poly-Si thin film transistors: Effect of metal thickness on silicon crystallization. in Materials Science Forum - Advanced Materials Forum III. vol. 514-516, pp. 28-32, Materiais 2005, 1/01/05.

Poly-Si thin film transistors: Effect of metal thickness on silicon crystallization. / Pereira, Luis Miguel Nunes; Barquinha, Pedro Miguel Cândido; Fortunato, Elvira Maria Correia; Martins, Rodrigo Ferrão de Paiva.

Materials Science Forum - Advanced Materials Forum III. Vol. 514-516 2006. p. 28-32.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Poly-Si thin film transistors: Effect of metal thickness on silicon crystallization

AU - Pereira, Luis Miguel Nunes

AU - Barquinha, Pedro Miguel Cândido

AU - Fortunato, Elvira Maria Correia

AU - Martins, Rodrigo Ferrão de Paiva

PY - 2006/1/1

Y1 - 2006/1/1

M3 - Conference contribution

VL - 514-516

SP - 28

EP - 32

BT - Materials Science Forum - Advanced Materials Forum III

ER -