Abstract
Cuprous oxide (Cu2O) is known to show significant variation in its electrical properties. This article presents a correlation between local conductivity and preferential orientation of grains in polycrystalline Cu2O thin films. Out-of-plane current in the grain region and in-plane macroscopic conductivity are analysed and both show the same orientation dependence: The {111}-oriented interfaces are more conductive than in the {100} orientation. In conjunction with the columnar growth of the films, this shows that electrical properties of polycrystalline Cu2O thin films are dependent on the grain facet orientation.
Original language | English |
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Article number | 075016 |
Journal | Semiconductor Science And Technology |
Volume | 35 |
Issue number | 7 |
DOIs | |
Publication status | Published - Jul 2020 |
Keywords
- conductive atomic force microscopy
- copper oxide
- facets
- grain boundaries
- Preferential orientation