Abstract

Cuprous oxide (Cu2O) is known to show significant variation in its electrical properties. This article presents a correlation between local conductivity and preferential orientation of grains in polycrystalline Cu2O thin films. Out-of-plane current in the grain region and in-plane macroscopic conductivity are analysed and both show the same orientation dependence: The {111}-oriented interfaces are more conductive than in the {100} orientation. In conjunction with the columnar growth of the films, this shows that electrical properties of polycrystalline Cu2O thin films are dependent on the grain facet orientation.

Original languageEnglish
Article number075016
JournalSemiconductor Science And Technology
Volume35
Issue number7
DOIs
Publication statusPublished - Jul 2020

Keywords

  • conductive atomic force microscopy
  • copper oxide
  • facets
  • grain boundaries
  • Preferential orientation

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