Abstract
Gallium-doped zinc oxide films were prepared by r.f. magnetron sputtering at room temperature as a function of the substrate-target distance. The best results were obtained for a distance of 10 cm, where a resistivity as low as 2. 7 × 10-4 Ω cm, a Hall mobility of 18 cm2/Vs and a carrier concentration of 1.3 × 1021 cm-3 were achieved. The films are polycrystalline presenting a strong crystallographic c-axis orientation (002) perpendicular to the substrate. The films present an overall transmittance in the visible part of the spectra of approximately 85%, on average.
Original language | English |
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Pages (from-to) | 102-106 |
Number of pages | 5 |
Journal | Thin Solid Films |
Volume | 442 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 1 Oct 2003 |
Keywords
- Electrical properties and measurements
- Optical properties
- Sputtering
- Zinc oxide