Negative ion formation through dissociative electron attachment to the group IV tetrafluorides: Carbon tetrafluoride, silicon tetrafluoride and germanium tetrafluoride

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)

Abstract

Dissociative electron attachment (DEA) to the group IV tetrafluorides: CF4, SiF4 and GeF4, is reported in the incident electron energy range from about 0 to 14 eV. The F-2(-) formation from CF4 is established and the appearance energies (AEs) for F-, CF3- and F-2(-) are determined using a three-point calibration for the energy scale. These are found to be 4.7 +/- 0.1 eV, 4.5 +/- 0.1 eV and 5.6 +/- 0.1 eV, respectively. For SiF4 the AEs for F-, SiF3- and F-2(-), through the dominating resonance are found to be 10.2 +/- 0.1 eV, 10.2 +/- 0.1 eV and 10.3 +/- 0.1 eV, respectively. From GeF4 the molecular ion GeF4- and the fragments GeF3-, GeF2-, GeF- and F- are all observed with appreciable intensities, and the F- production is found to be significantly close to 0 eV incident electron energy. The present findings are compared with earlier experiments and discussed in context to the thermochemistry of the respective processes as well as the nature of the underlying resonances
Original languageUnknown
Pages (from-to)45-53
Number of pages9
JournalInternational Journal of Mass Spectrometry
Volume339
DOIs
Publication statusPublished - 1 Apr 2013

Keywords

  • Dissociative electron attachment
  • Carbon tetrafluoride
  • Silicon tetrafluoride
  • Germanium tetrafluoride

Cite this