Abstract
To achieve highly accurate controlled depositions a specially designed vapour source, for metals with low to medium melting temperature, was developed. A quartz crystal microbalance is fitted inside the evaporation chamber to provide real-time rate and thickness monitoring. A carefully planned geometry allows maintaining a small deposition area centred on the sample without compromising flow rate measurements. Dosing rates as low as 0.02 ML/min are easily achieved, therefore providing true sub-monolayer control. This source was tested and calibrated for Ag and is being successfully used to study the growth of Ag clusters on TiO2.
Original language | Unknown |
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Pages (from-to) | 1529-1531 |
Journal | Vacuum |
Volume | 81 |
Issue number | 11-12 |
DOIs | |
Publication status | Published - 1 Jan 2007 |