Medium Electric Field Electron Injection/Extraction at Metal-Dielectric Interface

Eugen Neagu, Carlos Jorge Mariano Miranda Dias, Rui Alberto Garção Barreira do Nascimento Igreja, Maria do Carmo Henriques Lança

DCM - Departamento de Ciência dos Materiais

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cite this

@inproceedings{e022617edfb84e9ba5f770a3813eea24,

title = "Medium Electric Field Electron Injection/Extraction at Metal-Dielectric Interface",

abstract = "The isothermal charging current and the isothermal discharging current in low mobility materials are analyzed either in terms of polarization mechanisms or in terms of charge injection/extraction at the metal-dielectric interface and the conduction current through the dielectric material. We propose to measure the open-circuit isothermal charging and discharging currents just to overpass the difficulties related to the analysis of the conduction mechanisms in dielectric materials. We demonstrate that besides a polarization current there is a current related to charge injection or extraction at the metal-dielectric interface and a reverse current related to the charge trapped into the shallow superficial or near superficial states of the dielectric and which can move at the interface in the opposite way that occurring during injection. Two important parameters can be determined (i) the highest value of the relaxation time for the polarization mechanisms which are involved into the transient current and (ii) the height of the potential barrier W-0 at the metal-dielectric interface. The experimental data demonstrate that there is no threshold field for electron injection/extraction at a metal-dielectric interface.",

author = "Eugen Neagu and Dias, {Carlos Jorge Mariano Miranda} and Igreja, {Rui Alberto Gar{\c c}{\~a}o Barreira do Nascimento} and Lan{\c c}a, {Maria do Carmo Henriques}",

year = "2010",

month = jan,

day = "1",

doi = "10.4028/www.scientific.net/MSF.636-637.437",

language = "Unknown",

pages = "437--443",

booktitle = "Materials Science Forum",

note = "null ; Conference date: 01-01-2009",

}

TY - GEN

T1 - Medium Electric Field Electron Injection/Extraction at Metal-Dielectric Interface

AU - Neagu, Eugen

AU - Dias, Carlos Jorge Mariano Miranda

AU - Igreja, Rui Alberto Garção Barreira do Nascimento

AU - Lança, Maria do Carmo Henriques

PY - 2010/1/1

Y1 - 2010/1/1

N2 - The isothermal charging current and the isothermal discharging current in low mobility materials are analyzed either in terms of polarization mechanisms or in terms of charge injection/extraction at the metal-dielectric interface and the conduction current through the dielectric material. We propose to measure the open-circuit isothermal charging and discharging currents just to overpass the difficulties related to the analysis of the conduction mechanisms in dielectric materials. We demonstrate that besides a polarization current there is a current related to charge injection or extraction at the metal-dielectric interface and a reverse current related to the charge trapped into the shallow superficial or near superficial states of the dielectric and which can move at the interface in the opposite way that occurring during injection. Two important parameters can be determined (i) the highest value of the relaxation time for the polarization mechanisms which are involved into the transient current and (ii) the height of the potential barrier W-0 at the metal-dielectric interface. The experimental data demonstrate that there is no threshold field for electron injection/extraction at a metal-dielectric interface.

AB - The isothermal charging current and the isothermal discharging current in low mobility materials are analyzed either in terms of polarization mechanisms or in terms of charge injection/extraction at the metal-dielectric interface and the conduction current through the dielectric material. We propose to measure the open-circuit isothermal charging and discharging currents just to overpass the difficulties related to the analysis of the conduction mechanisms in dielectric materials. We demonstrate that besides a polarization current there is a current related to charge injection or extraction at the metal-dielectric interface and a reverse current related to the charge trapped into the shallow superficial or near superficial states of the dielectric and which can move at the interface in the opposite way that occurring during injection. Two important parameters can be determined (i) the highest value of the relaxation time for the polarization mechanisms which are involved into the transient current and (ii) the height of the potential barrier W-0 at the metal-dielectric interface. The experimental data demonstrate that there is no threshold field for electron injection/extraction at a metal-dielectric interface.

U2 - 10.4028/www.scientific.net/MSF.636-637.437

DO - 10.4028/www.scientific.net/MSF.636-637.437

M3 - Conference contribution

SP - 437

EP - 443

BT - Materials Science Forum

Y2 - 1 January 2009

ER -