Lumped element model for arbitrarily shaped integrated inductors — A statistical analysis

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Abstract

In this paper amodelbased inlumpedelementsis presentedforthe characterization ofintegratedinductors. Themodelallows themodellingofintegratedinductorsfora wide range of frequencies and differentinductortopologies, thus granting the evaluation of important design parameters such as inductance, quality factor and self-resonance frequency. Themodelwill be explained in detail and compared against electromagnetic simulationsfora 0.35-μm and 0.13-μm CMOS technologies. Resultsforsquare and octagonal geometries are presented. A statisticanalysisis also presentedforthe octagonal topology in order to validate themodelover a wide range of geometric variables in 0.35-μm CMOS technology.
Original languageUnknown
Title of host publication-
Pages1-5
DOIs
Publication statusPublished - 1 Jan 2013
Event2013 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems (COMCAS) -
Duration: 1 Jan 2013 → …

Conference

Conference2013 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems (COMCAS)
Period1/01/13 → …

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