In this paper amodelbased inlumpedelementsis presentedforthe characterization ofintegratedinductors. Themodelallows themodellingofintegratedinductorsfora wide range of frequencies and differentinductortopologies, thus granting the evaluation of important design parameters such as inductance, quality factor and self-resonance frequency. Themodelwill be explained in detail and compared against electromagnetic simulationsfora 0.35-μm and 0.13-μm CMOS technologies. Resultsforsquare and octagonal geometries are presented. A statisticanalysisis also presentedforthe octagonal topology in order to validate themodelover a wide range of geometric variables in 0.35-μm CMOS technology.
|Title of host publication||-|
|Publication status||Published - 1 Jan 2013|
|Event||2013 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems (COMCAS) - |
Duration: 1 Jan 2013 → …
|Conference||2013 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems (COMCAS)|
|Period||1/01/13 → …|