Light Ion Sputtering of Barium

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationSecondary Ion Mass Spectrometry SIMS X: Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry
EditorsA. Benninghoven, B. Hagenhoff, H. W. Hagenhoff
PublisherJohn Wiley & Sons
ISBN (Print)0-471-95897-2
Publication statusPublished - 1997

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