Ion temperature and x-ray line width measurements of highly charged argon ions in an ECR ion source

C. I. Szabo, P. Amaro, M. Guerra, J. P. Santos, A. Gumberidze, J. Attard, P. Indelicato

Research output: Contribution to journalConference article

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Abstract

In this paper, we show that high-precision x-ray line measurements with a double-crystal spectrometer (DCS) on the plasma of an electron cyclotron resonance ion source can provide an experimental method for the determination of the natural line widths of the measured transitions. This goal can be achieved with full characterization of the response function of the used DCS with the help of a very narrow x-ray line in helium-like argon and a simulation code fully describing the geometry of the source and the DCS.

Original languageEnglish
Article number014077
JournalPhysica Scripta
VolumeT156
DOIs
Publication statusPublished - 4 Dec 2013
Event16th International Conference on the Physics of Highly Charged Ions, HCI 2012 - Heidelberg, Germany
Duration: 2 Sep 20127 Sep 2012

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