Ion temperature and x-ray line width measurements of highly charged argon ions in an ECR ion source

C. I. Szabo; P. Amaro; M. Guerra; J. P. Santos; A. Gumberidze; J. Attard; P. Indelicato

doi:10.1088/0031-8949/2013/T156/014077

Ion temperature and x-ray line width measurements of highly charged argon ions in an ECR ion source

C. I. Szabo, P. Amaro, M. Guerra, J. P. Santos, A. Gumberidze, J. Attard, P. Indelicato

DF – Departamento de Física

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

In this paper, we show that high-precision x-ray line measurements with a double-crystal spectrometer (DCS) on the plasma of an electron cyclotron resonance ion source can provide an experimental method for the determination of the natural line widths of the measured transitions. This goal can be achieved with full characterization of the response function of the used DCS with the help of a very narrow x-ray line in helium-like argon and a simulation code fully describing the geometry of the source and the DCS.

Original language	English
Article number	014077
Journal	Physica Scripta
Volume	T156
DOIs	https://doi.org/10.1088/0031-8949/2013/T156/014077
Publication status	Published - 4 Dec 2013
Event	16th International Conference on the Physics of Highly Charged Ions, HCI 2012 - Heidelberg, Germany Duration: 2 Sept 2012 → 7 Sept 2012

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10.1088/0031-8949/2013/T156/014077Licence: CC BY-NC-ND

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title = "Ion temperature and x-ray line width measurements of highly charged argon ions in an ECR ion source",

abstract = "In this paper, we show that high-precision x-ray line measurements with a double-crystal spectrometer (DCS) on the plasma of an electron cyclotron resonance ion source can provide an experimental method for the determination of the natural line widths of the measured transitions. This goal can be achieved with full characterization of the response function of the used DCS with the help of a very narrow x-ray line in helium-like argon and a simulation code fully describing the geometry of the source and the DCS.",

author = "Szabo, {C. I.} and P. Amaro and M. Guerra and Santos, {J. P.} and A. Gumberidze and J. Attard and P. Indelicato",

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TY - JOUR

T1 - Ion temperature and x-ray line width measurements of highly charged argon ions in an ECR ion source

AU - Szabo, C. I.

AU - Amaro, P.

AU - Guerra, M.

AU - Santos, J. P.

AU - Gumberidze, A.

AU - Attard, J.

AU - Indelicato, P.

PY - 2013/12/4

Y1 - 2013/12/4

N2 - In this paper, we show that high-precision x-ray line measurements with a double-crystal spectrometer (DCS) on the plasma of an electron cyclotron resonance ion source can provide an experimental method for the determination of the natural line widths of the measured transitions. This goal can be achieved with full characterization of the response function of the used DCS with the help of a very narrow x-ray line in helium-like argon and a simulation code fully describing the geometry of the source and the DCS.

AB - In this paper, we show that high-precision x-ray line measurements with a double-crystal spectrometer (DCS) on the plasma of an electron cyclotron resonance ion source can provide an experimental method for the determination of the natural line widths of the measured transitions. This goal can be achieved with full characterization of the response function of the used DCS with the help of a very narrow x-ray line in helium-like argon and a simulation code fully describing the geometry of the source and the DCS.

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U2 - 10.1088/0031-8949/2013/T156/014077

DO - 10.1088/0031-8949/2013/T156/014077

M3 - Conference article

AN - SCOPUS:84888635439

SN - 0281-1847

VL - T156

JO - Physica Scripta

JF - Physica Scripta

M1 - 014077

T2 - 16th International Conference on the Physics of Highly Charged Ions, HCI 2012

Y2 - 2 September 2012 through 7 September 2012

ER -

Ion temperature and x-ray line width measurements of highly charged argon ions in an ECR ion source

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