@article{ad08e4cd0f4544a1b0a97939a13c9f88,
title = "Ion-plasma treatment of reed switch contacts: A study by time-of-flight secondary ion mass spectrometry",
abstract = "A TOF.SIMS-5 time-of-flight secondary ion mass spectrometer operating with pulsed 25-keV Bi+ ions for analysis and 2-keV Cs+ ions for sputter ion-beam etching was employed for studying the near-surface composition of iron-nickel (permalloy) contacts (blades) after the treatment in pulsed nitrogen plasma directly in hermetically sealed reed switches. The formation of 20- to 25-nm thick oxynitride coatings in the contacting region of the blades was observed. It was found that this coating was of the diffusive nature and produced via the plasma nitriding of the contacts.",
keywords = "cathode sputtering, ion nitriding, ion-plasma treatment, reed switch, sputter depth profiling, time-of-flight secondary ion mass spectrometry",
author = "Tolstoguzov, {A. B.} and Drozdov, {M. N.} and Zeltser, {I. A.} and Arushanov, {K. A.} and Teodoro, {Orlando M N D}",
note = "This work was supported by OAO Ryazanskii Zavod Metallokeramicheskikh Priborov (Ryazan Metal Ceramics Instrumentation Plant Joint Stock Company), the Ministry of Education and Science of the Russian Federation (contract no. 14.V37.21.0895), the Portuguese Foundation for Science and Technology (project PTDC/CTM-ENE/2514/2012), and via the programs of the Presidium of the Russian Academy of Sciences, and the Russian Foundation for Basic Research (project no. 12-02-00548). The equipment of the Institute for Physics of Microstructures, Russian Academy of Sciences (Nizhni Novgorod) was used in this study.",
year = "2014",
month = dec,
day = "12",
doi = "10.1134/S1061934814130115",
language = "English",
volume = "69",
pages = "1245--1251",
journal = "Journal Of Analytical Chemistry",
issn = "1061-9348",
publisher = "Springer Science Business Media",
number = "13",
}