Investigations of space charge distributions by atomic force microscope

Kapil Faliya; Herbert Kliem; Carlos J. Dias

doi:10.1109/ICD.2016.7547584

Investigations of space charge distributions by atomic force microscope

Kapil Faliya, Herbert Kliem, Carlos J. Dias

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Citations (Scopus)

Abstract

The requirement of the investigation of the space charge distribution in dielectric materials with less than one micrometer resolution draws the attention on the use of the atomic force microscope. The surface potential measurement by the Kelvin Probe Force Microscopy (KPFM) enables to calculate the space charges by solving Poisson equation for electrostatics. To overcome the noise problem in experimental data, a proper smoothing and derivative procedure has been developed to find the space charge and the electric field distribution.

Original language	English
Title of host publication	Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	219-222
Number of pages	4
Volume	1
ISBN (Electronic)	978-1-5090-2804-7
DOIs	https://doi.org/10.1109/ICD.2016.7547584
Publication status	Published - 18 Aug 2016
Event	1st IEEE International Conference on Dielectrics, ICD 2016 - Montpellier, France Duration: 3 Jul 2016 → 7 Jul 2016

Conference

Conference	1st IEEE International Conference on Dielectrics, ICD 2016
Country/Territory	France
City	Montpellier
Period	3/07/16 → 7/07/16

Keywords

Energy & Fuels
Engineering, Electrical & Electronic
Atomic force microscopy
Charge distribution
Poisson equation
Surface potential measurements
Dielectric materials

Access to Document

10.1109/ICD.2016.7547584

Cite this

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title = "Investigations of space charge distributions by atomic force microscope",

abstract = "The requirement of the investigation of the space charge distribution in dielectric materials with less than one micrometer resolution draws the attention on the use of the atomic force microscope. The surface potential measurement by the Kelvin Probe Force Microscopy (KPFM) enables to calculate the space charges by solving Poisson equation for electrostatics. To overcome the noise problem in experimental data, a proper smoothing and derivative procedure has been developed to find the space charge and the electric field distribution.",

keywords = "Energy & Fuels, Engineering, Electrical & Electronic, Atomic force microscopy, Charge distribution, Poisson equation, Surface potential measurements, Dielectric materials",

author = "Kapil Faliya and Herbert Kliem and Dias, {Carlos J.}",

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Faliya, K, Kliem, H & Dias, CJ 2016, Investigations of space charge distributions by atomic force microscope. in Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016. vol. 1, 7547584, Institute of Electrical and Electronics Engineers (IEEE), pp. 219-222, 1st IEEE International Conference on Dielectrics, ICD 2016, Montpellier, France, 3/07/16. https://doi.org/10.1109/ICD.2016.7547584

Investigations of space charge distributions by atomic force microscope. / Faliya, Kapil; Kliem, Herbert; Dias, Carlos J.
Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016. Vol. 1 Institute of Electrical and Electronics Engineers (IEEE), 2016. p. 219-222 7547584.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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KW - Engineering, Electrical & Electronic

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KW - Charge distribution

KW - Poisson equation

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Investigations of space charge distributions by atomic force microscope

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