Investigations of space charge distributions by atomic force microscope

Kapil Faliya, Herbert Kliem, Carlos J. Dias

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

The requirement of the investigation of the space charge distribution in dielectric materials with less than one micrometer resolution draws the attention on the use of the atomic force microscope. The surface potential measurement by the Kelvin Probe Force Microscopy (KPFM) enables to calculate the space charges by solving Poisson equation for electrostatics. To overcome the noise problem in experimental data, a proper smoothing and derivative procedure has been developed to find the space charge and the electric field distribution.

Original languageEnglish
Title of host publicationProceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages219-222
Number of pages4
Volume1
ISBN (Electronic)978-1-5090-2804-7
DOIs
Publication statusPublished - 18 Aug 2016
Event1st IEEE International Conference on Dielectrics, ICD 2016 - Montpellier, France
Duration: 3 Jul 20167 Jul 2016

Conference

Conference1st IEEE International Conference on Dielectrics, ICD 2016
CountryFrance
CityMontpellier
Period3/07/167/07/16

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Keywords

  • Energy & Fuels
  • Engineering, Electrical & Electronic
  • Atomic force microscopy
  • Charge distribution
  • Poisson equation
  • Surface potential measurements
  • Dielectric materials

Cite this

Faliya, K., Kliem, H., & Dias, C. J. (2016). Investigations of space charge distributions by atomic force microscope. In Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016 (Vol. 1, pp. 219-222). [7547584] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICD.2016.7547584