(Formula presented.) X-ray lines from photon excitation were measured in selected elements from Mg to Cu using a high-resolution double-crystal X-ray spectrometer with a proportional counter, and the (Formula presented.) intensity ratio for each element was obtained, after correcting for self-absorption, detection efficiency, and crystal reflectance. This intensity ratio increases rapidly from Mg to Ca but, in the (Formula presented.) elements region, the increase becomes slower. This is related to the intensity of the (Formula presented.) line involving valence electrons. The slow increase of this ratio in the (Formula presented.) elements region is thought to be due to the correlation between (Formula presented.) and (Formula presented.) electrons. Moreover, the chemical shifts, FWHM, asymmetry indices, and (Formula presented.) intensity ratios of the Cr compounds, due to different valences, were also investigated using the same double-crystal X-ray spectrometer. The chemical effects were clearly observed, and the (Formula presented.) intensity ratio was found to be compound-dependent for Cr.
- atomic fundamental parameters
- chemical effects on intensity ratios
- X-ray intensity ratios