A novel method for calculation of energy dependence of a secondary electron emission yield for different incidence angles is proposed. The model is based on the semi-empirical law for secondary electron yield and a Monte Carlo simulation of reflected primary energy. Initial tests show good agreement between the model and the experiment.
|Title of host publication||Proceedings of the 14th IEEE International Vacuum Electronics Conference (IVEC 2013)|
|Publication status||Published - 1 Jan 2013|
|Event||IVEC 2013: 14th IEEE International Vacuum Electronics Conference - |
Duration: 1 Jan 2013 → …
|Conference||IVEC 2013: 14th IEEE International Vacuum Electronics Conference|
|Period||1/01/13 → …|