Influence of the Incident Angle on Energy Dependence of a Secondary Electron Emission Yield

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Abstract

A novel method for calculation of energy dependence of a secondary electron emission yield for different incidence angles is proposed. The model is based on the semi-empirical law for secondary electron yield and a Monte Carlo simulation of reflected primary energy. Initial tests show good agreement between the model and the experiment.
Original languageUnknown
Title of host publicationProceedings of the 14th IEEE International Vacuum Electronics Conference (IVEC 2013)
Pages1-2
Volume1
DOIs
Publication statusPublished - 1 Jan 2013
EventIVEC 2013: 14th IEEE International Vacuum Electronics Conference -
Duration: 1 Jan 2013 → …

Conference

ConferenceIVEC 2013: 14th IEEE International Vacuum Electronics Conference
Period1/01/13 → …

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