Highly conductive and highly transparent n-type microcrystalline silicon thin films

R. Martins, A. Maçarico, I. Ferreira, R. Nunes, A. Bicho, E. Fortunato

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30 Citations (Scopus)


The aim of this paper is to present data on the dependence of the electro-optical characteristics and structure of n-type microcrystalline silicon films on the r.f. power used during the deposition of films produced by the plasma-enhanced chemical vapour deposition technique. The interest of these films arise from the fact that they combine some electro-optical advantages of amorphous (wide optical gap) and crystalline materials (electronic behaviour), highly interesting in the production of a wide variety of optoelectronic devices such as solar cells and thin film transistors. In this paper, microcrystalline n-type films presenting simultaneously optical gaps of about 2.3 eV, dark conductivity of 6.5 S cm-1 and Hall mobility of about 0.86 cm2 V-1 s-1 will be reported, the highest combined values for n-type microcrystalline silicon films, as far as we know.

Original languageEnglish
Pages (from-to)47-52
Number of pages6
JournalThin Solid Films
Issue number1-2
Publication statusPublished - 15 Jul 1997


  • Electrical properties and measurements
  • Hall effect
  • Raman scattering
  • Silicon


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