Fault-tolerant voltage-source-inverters for switched reluctance motor drives

Armando Cordeiro, V. Fernão Pires, A. J. Pires, J. F. Martins, Hao Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

This paper proposes several modifications of the conventional Asymmetric Half-Bridge (ABH) topology for switched reluctance motor (SRM) drives with the aim of increasing its reliability to safety critical applications. This solution intends to achieve fast changing between main and standby redundant devices in fault-tolerant ABH topologies through the combination of mechanical commutators and semiconductors. With those modifications, the energy processing capability can be maintained for the most common failure modes. A survey of previously developed fault tolerant topologies for SRM drives and several aspects of failure modes, detection and isolation mechanisms are also included. The theoretical validity of one the proposed solutions is confirmed by several experimental results.

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE 13th International Conference on Compatibility, Power Electronics and Power Engineering, CPE-POWERENG 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728132020
DOIs
Publication statusPublished - Apr 2019
Event13th IEEE International Conference on Compatibility, Power Electronics and Power Engineering, CPE-POWERENG 2019 - Sonderborg, Denmark
Duration: 23 Apr 201925 Apr 2019

Conference

Conference13th IEEE International Conference on Compatibility, Power Electronics and Power Engineering, CPE-POWERENG 2019
CountryDenmark
CitySonderborg
Period23/04/1925/04/19

Keywords

  • Asymmetric half bridge topology
  • Fault-tolerant topology
  • Power electronics reliability
  • Power semiconductor failure
  • SRM drive

Fingerprint Dive into the research topics of 'Fault-tolerant voltage-source-inverters for switched reluctance motor drives'. Together they form a unique fingerprint.

Cite this