Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver

T. Gineste, M. Belhaj, N. Bundaleski, O. M. N. D. Teodoro, C. Pons, J. Puech, N. Balcon

Research output: Contribution to conferenceOther

Abstract

The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.
Original languageEnglish
Pages1-2
DOIs
Publication statusPublished - May 2013
EventIVEC 2013: 14th IEEE International Vacuum Electronics Conference -
Duration: 1 Jan 2013 → …

Conference

ConferenceIVEC 2013: 14th IEEE International Vacuum Electronics Conference
Period1/01/13 → …

Keywords

  • multipactor effect
  • secondary electron emission
  • backscattered electron
  • incidence angle effect on electron emission
  • Silver

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