Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver

T. Gineste; M. Belhaj; N. Bundaleski; O. M. N. D. Teodoro; C. Pons; J. Puech; N. Balcon

doi:10.1109/IVEC.2013.6571182

Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver

T. Gineste, M. Belhaj, N. Bundaleski, O. M. N. D. Teodoro, C. Pons, J. Puech, N. Balcon

Research output: Contribution to conference › Other › peer-review

Abstract

The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.

Original language	English
Pages	1-2
DOIs	https://doi.org/10.1109/IVEC.2013.6571182
Publication status	Published - May 2013
Event	IVEC 2013: 14th IEEE International Vacuum Electronics Conference - Duration: 1 Jan 2013 → …

Conference

Conference	IVEC 2013: 14th IEEE International Vacuum Electronics Conference
Period	1/01/13 → …

Keywords

multipactor effect
secondary electron emission
backscattered electron
incidence angle effect on electron emission
Silver

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10.1109/IVEC.2013.6571182Licence: Unspecified

http://ieeexplore.ieee.org/document/6571182/

Cite this

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title = "Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver",

abstract = "The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.",

keywords = "multipactor effect, secondary electron emission, backscattered electron, incidence angle effect on electron emission, Silver",

author = "T. Gineste and M. Belhaj and N. Bundaleski and Teodoro, {O. M. N. D.} and C. Pons and J. Puech and N. Balcon",

note = "Sem PDF.; IVEC 2013: 14th IEEE International Vacuum Electronics Conference ; Conference date: 01-01-2013",

year = "2013",

month = may,

doi = "10.1109/IVEC.2013.6571182",

language = "English",

pages = "1--2",

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TY - CONF

T1 - Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver

AU - Gineste, T.

AU - Belhaj, M.

AU - Bundaleski, N.

AU - Teodoro, O. M. N. D.

AU - Pons, C.

AU - Puech, J.

AU - Balcon, N.

N1 - Sem PDF.

PY - 2013/5

Y1 - 2013/5

N2 - The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.

AB - The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.

KW - multipactor effect

KW - secondary electron emission

KW - backscattered electron

KW - incidence angle effect on electron emission

KW - Silver

U2 - 10.1109/IVEC.2013.6571182

DO - 10.1109/IVEC.2013.6571182

M3 - Other

SP - 1

EP - 2

T2 - IVEC 2013: 14th IEEE International Vacuum Electronics Conference

Y2 - 1 January 2013

ER -

Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver

Abstract

Conference

Keywords

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