Event life time in detection of sequences of events

Rogerio Campos-Rebelo, Aniko Costa, Luis Gomes

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper addresses the use of events within discrete-event systems modeling formalisms, presenting the concept of event life time when enclosed in the detection of a specific behavior defined by sequences of events. This concept defines the time interval during which a macro-event is valid (a macro-event is an event computed as the result of a pre-defined sequence of events). Two types of life times are defined: Absolute and Relative. Absolute life time is associated with the maximum time between the occurrence of the first and last event in the sequence. The relative life time is associated with each elementary event from the sequence and is defined by minimum and maximum values among which the next event in the sequence must occur. If the next event does not occur during the defined time, the event expires. Finally the use of these concepts is discussed presenting some specific cases of use.

Original languageEnglish
Title of host publication2015 IEEE International Conference on Industrial Technology (ICIT)
Place of PublicationNew York
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3144-3149
Number of pages6
Volume2015-June
ISBN (Electronic)978-1-4799-7800-7
DOIs
Publication statusPublished - 16 Jun 2015
Event2015 IEEE International Conference on Industrial Technology, ICIT 2015 - Seville, Spain
Duration: 17 Mar 201519 Mar 2015

Conference

Conference2015 IEEE International Conference on Industrial Technology, ICIT 2015
CountrySpain
CitySeville
Period17/03/1519/03/15

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Keywords

  • Security
  • Complexity theory
  • Petri nets
  • Computer architecture
  • Analytical models
  • Delays

Cite this

Campos-Rebelo, R., Costa, A., & Gomes, L. (2015). Event life time in detection of sequences of events. In 2015 IEEE International Conference on Industrial Technology (ICIT) (Vol. 2015-June, pp. 3144-3149). [7125562] New York: Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICIT.2015.7125562