TY - JOUR
T1 - Enhanced sputtering yield of nanostructured samples under Ar+ cluster bombardment
AU - Pelenovich, Vasiliy
AU - Zeng, Xiaomei
AU - Zuo, Wenbin
AU - Tolstogouzov, Alexander
AU - Gololobov, Gennady
AU - Suvorov, Dmitriy
AU - Slivkin, Evgeniy
AU - Hu, Donghong
AU - Tian, Canxin
AU - D, Neena
AU - Fu, Dejun
AU - Yang, Bing
N1 - Funding Information:
This work was supported by the National Natural Science Foundation of China under grant 11875210 , the Science and Technology Planning Project of Guangdong Province under grant 2018A050506082 , China Postdoctoral Science Foundation under grant 2019M652687 , and the Ministry of Education and Science of the Russian Federation in the framework of the state assignment under grant 11.9686.2017/8.9 .
PY - 2020/2
Y1 - 2020/2
N2 - Ar2900 clusters with energy in the range of 10.4–69 keV were used to bombard the surface of pressed Si nanopowder targets. High nonmonotonic sputtering yield is observed within the energy range of 10.4–34.5 keV, which is considered as enhanced by the finite size effect of the target particles. The cluster bombardment results in the sputtering of Si nanoparticles with a mean size of ca. 12 nm. The number of the sputtered nanoparticles is correlated with the sputtering yield within the energy range of 10.4–34.5 keV. Hence, their formation is associated with the finite size effect. Scanning electron microscopy revealed the formation of debris on the target surface starting at the cluster energy of 15.3 keV, which results in reducing the finite size effect and consequently the sputtering yield. Individual impacts of the argon clusters are observed as craters of 3–6 nm in diameter on the Si particles surface. The crater formation is considered to be responsible for the sputtering at the cluster energy in the range of 15.3–69 keV.
AB - Ar2900 clusters with energy in the range of 10.4–69 keV were used to bombard the surface of pressed Si nanopowder targets. High nonmonotonic sputtering yield is observed within the energy range of 10.4–34.5 keV, which is considered as enhanced by the finite size effect of the target particles. The cluster bombardment results in the sputtering of Si nanoparticles with a mean size of ca. 12 nm. The number of the sputtered nanoparticles is correlated with the sputtering yield within the energy range of 10.4–34.5 keV. Hence, their formation is associated with the finite size effect. Scanning electron microscopy revealed the formation of debris on the target surface starting at the cluster energy of 15.3 keV, which results in reducing the finite size effect and consequently the sputtering yield. Individual impacts of the argon clusters are observed as craters of 3–6 nm in diameter on the Si particles surface. The crater formation is considered to be responsible for the sputtering at the cluster energy in the range of 15.3–69 keV.
KW - Finite size effect
KW - Gas cluster ion beam
KW - Silicon nanoparticles
KW - Smoothing effect
KW - Sputtering
UR - http://www.scopus.com/inward/record.url?scp=85075531117&partnerID=8YFLogxK
U2 - 10.1016/j.vacuum.2019.109096
DO - 10.1016/j.vacuum.2019.109096
M3 - Article
AN - SCOPUS:85075531117
SN - 0042-207X
VL - 172
SP - 604
EP - 640
JO - Vacuum
JF - Vacuum
M1 - 109096
ER -