Energy band alignment at the nanoscale

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Abstract

The energy band alignments at interfaces often determine the electrical functionality of a device. Along with the size reduction into the nanoscale, functional coatings become thinner than a nanometer. With the traditional analysis of the energy band alignment by in situ photoelectron spectroscopy, a critical film thickness is needed to determine the valence band offset. By making use of the Auger parameter, it becomes possible to determine the energy band alignment to coatings, which are only a few Ångström thin. This is demonstrated with experimental data of Cu2O on different kinds of substrate materials.

Original languageEnglish
Article number051603
JournalApplied Physics Letters
Volume110
Issue number5
DOIs
Publication statusPublished - 30 Jan 2017

Keywords

  • AUGER PARAMETER
  • THIN-FILMS
  • INTERFACE
  • CU2O
  • CUO
  • XPS
  • SHIFTS
  • Oxide clusters

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