Energy band alignment at the nanoscale

Jonas Deuermeier; Elvira Fortunato; Rodrigo Martins; Andreas Klein

doi:10.1063/1.4975644

Energy band alignment at the nanoscale

Jonas Deuermeier, Elvira Fortunato, Rodrigo Martins, Andreas Klein

Research output: Contribution to journal › Article

1 Citation (Scopus)

Abstract

The energy band alignments at interfaces often determine the electrical functionality of a device. Along with the size reduction into the nanoscale, functional coatings become thinner than a nanometer. With the traditional analysis of the energy band alignment by in situ photoelectron spectroscopy, a critical film thickness is needed to determine the valence band offset. By making use of the Auger parameter, it becomes possible to determine the energy band alignment to coatings, which are only a few Ångström thin. This is demonstrated with experimental data of Cu₂O on different kinds of substrate materials.

Original language	English
Article number	051603
Journal	Applied Physics Letters
Volume	110
Issue number	5
DOIs	https://doi.org/10.1063/1.4975644
Publication status	Published - 30 Jan 2017

Keywords

AUGER PARAMETER
THIN-FILMS
INTERFACE
CU2O
CUO
XPS
SHIFTS
Oxide clusters

Access to Document

10.1063/1.4975644Licence: Unspecified

Link to publication in Scopus

Fingerprint Dive into the research topics of 'Energy band alignment at the nanoscale'. Together they form a unique fingerprint.

Cite this

Deuermeier, J., Fortunato, E., Martins, R., & Klein, A. (2017). Energy band alignment at the nanoscale. Applied Physics Letters, 110(5), [051603]. https://doi.org/10.1063/1.4975644

@article{ca1cee2c39aa40648087febe584bb38b,

title = "Energy band alignment at the nanoscale",

abstract = "The energy band alignments at interfaces often determine the electrical functionality of a device. Along with the size reduction into the nanoscale, functional coatings become thinner than a nanometer. With the traditional analysis of the energy band alignment by in situ photoelectron spectroscopy, a critical film thickness is needed to determine the valence band offset. By making use of the Auger parameter, it becomes possible to determine the energy band alignment to coatings, which are only a few {\AA}ngstr{\"o}m thin. This is demonstrated with experimental data of Cu2O on different kinds of substrate materials.",

keywords = "AUGER PARAMETER, THIN-FILMS, INTERFACE, CU2O, CUO, XPS, SHIFTS, Oxide clusters",

author = "Jonas Deuermeier and Elvira Fortunato and Rodrigo Martins and Andreas Klein",

note = "Sem PDF. FEDER funds through the COMPETE program national funds through FCT-Portuguese Foundation for Science and Technology (POCI-01-0145-FEDER-007688; UID/CTM/50025) German Science Foundation within the collaborative research center (SFB 595) SFRH/BD/77103/2011 UID/CTM/50025/2013 PEst-C/CTM/LA0025/2013-14 EXCL/CTM-NAN/0201/2012",

year = "2017",

month = "1",

day = "30",

doi = "10.1063/1.4975644",

language = "English",

volume = "110",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "AMER INST PHYSICS",

number = "5",

}

TY - JOUR

T1 - Energy band alignment at the nanoscale

AU - Deuermeier, Jonas

AU - Fortunato, Elvira

AU - Martins, Rodrigo

AU - Klein, Andreas

N1 - Sem PDF. FEDER funds through the COMPETE program national funds through FCT-Portuguese Foundation for Science and Technology (POCI-01-0145-FEDER-007688; UID/CTM/50025) German Science Foundation within the collaborative research center (SFB 595) SFRH/BD/77103/2011 UID/CTM/50025/2013 PEst-C/CTM/LA0025/2013-14 EXCL/CTM-NAN/0201/2012

PY - 2017/1/30

Y1 - 2017/1/30

N2 - The energy band alignments at interfaces often determine the electrical functionality of a device. Along with the size reduction into the nanoscale, functional coatings become thinner than a nanometer. With the traditional analysis of the energy band alignment by in situ photoelectron spectroscopy, a critical film thickness is needed to determine the valence band offset. By making use of the Auger parameter, it becomes possible to determine the energy band alignment to coatings, which are only a few Ångström thin. This is demonstrated with experimental data of Cu2O on different kinds of substrate materials.

AB - The energy band alignments at interfaces often determine the electrical functionality of a device. Along with the size reduction into the nanoscale, functional coatings become thinner than a nanometer. With the traditional analysis of the energy band alignment by in situ photoelectron spectroscopy, a critical film thickness is needed to determine the valence band offset. By making use of the Auger parameter, it becomes possible to determine the energy band alignment to coatings, which are only a few Ångström thin. This is demonstrated with experimental data of Cu2O on different kinds of substrate materials.

KW - AUGER PARAMETER

KW - THIN-FILMS

KW - INTERFACE

KW - CU2O

KW - CUO

KW - XPS

KW - SHIFTS

KW - Oxide clusters

UR - http://www.scopus.com/inward/record.url?scp=85011709959&partnerID=8YFLogxK

U2 - 10.1063/1.4975644

DO - 10.1063/1.4975644

M3 - Article

AN - SCOPUS:85011709959

VL - 110

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 5

M1 - 051603

ER -