Electronic excitation to low-lying states of GeF4 molecule by electron impact: A comparative study with CF4 and SiF4 molecules

S. Ohtomi; M. Matsui; Y. Mochizuki; A. Suga; H. Kato; M. Hoshino; D. Duflot; P. Limão-Vieira; Hideaki Tanaka

doi:10.1088/1742-6596/635/7/072041

Electronic excitation to low-lying states of GeF₄ molecule by electron impact: A comparative study with CF₄ and SiF₄ molecules

S. Ohtomi, M. Matsui, Y. Mochizuki, A. Suga, H. Kato, M. Hoshino, D. Duflot, P. Limão-Vieira, Hideaki Tanaka

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Downloads (Pure)

Abstract

We report on the measurements of the electron impact electronic excitation cross sections for XF₄ (X = C, Si and Ge) molecules at 100 eV, 5° scattering angle and 30 eV, 30° in the electron energy loss range 8.0 - 18 eV. For a target of GeF₄ molecule, the optically-forbidden behavior has been observed in the lower electron energy loss range.

Original language	English
Title of host publication	XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)
Editors	C. Diaz, I. Rabadan, G. Garcia, L. Mendez, F. Martin
Place of Publication	Bristol, UK
Publisher	IOP Publishing Ltd.
Volume	Part 1-12
DOIs	https://doi.org/10.1088/1742-6596/635/7/072041
Publication status	Published - 7 Sep 2015
Event	29th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015) - Toledo, Spain Duration: 22 Jul 2015 → 28 Jul 2015 Conference number: 29th

Publication series

Name	Journal Of Physics: Conference Series
Publisher	IOP Publishing Ltd.
Number	7
Volume	635
ISSN (Print)	1742-6588

Conference

Conference	29th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)
Abbreviated title	ICPEAC 2015
Country	Spain
City	Toledo
Period	22/07/15 → 28/07/15

Keywords

SCATTERING
SPECTROSCOPY

Access to Document

10.1088/1742-6596/635/7/072041Licence: CC BY

Ohtomi_2015_JPhysConfSer_635_072041Final published version, 406 KBLicence: CC BY

Link to publication in Scopus

Fingerprint Dive into the research topics of 'Electronic excitation to low-lying states of GeF4 molecule by electron impact: A comparative study with CF4 and SiF4 molecules'. Together they form a unique fingerprint.

Cite this

Ohtomi, S., Matsui, M., Mochizuki, Y., Suga, A., Kato, H., Hoshino, M., Duflot, D., Limão-Vieira, P., & Tanaka, H. (2015). Electronic excitation to low-lying states of GeF₄ molecule by electron impact: A comparative study with CF₄ and SiF₄ molecules. In C. Diaz, I. Rabadan, G. Garcia, L. Mendez, & F. Martin (Eds.), XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015) (Vol. Part 1-12). [072041] (Journal Of Physics: Conference Series; Vol. 635, No. 7). IOP Publishing Ltd.. https://doi.org/10.1088/1742-6596/635/7/072041

Ohtomi, S. ; Matsui, M. ; Mochizuki, Y. ; Suga, A. ; Kato, H. ; Hoshino, M. ; Duflot, D. ; Limão-Vieira, P. ; Tanaka, Hideaki. / Electronic excitation to low-lying states of GeF₄ molecule by electron impact : A comparative study with CF₄ and SiF₄ molecules. XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015). editor / C. Diaz ; I. Rabadan ; G. Garcia ; L. Mendez ; F. Martin. Vol. Part 1-12 Bristol, UK : IOP Publishing Ltd., 2015. (Journal Of Physics: Conference Series; 7).

@inproceedings{543aa88387e442568ce8edde0aba7b43,

title = "Electronic excitation to low-lying states of GeF4 molecule by electron impact: A comparative study with CF4 and SiF4 molecules",

abstract = "We report on the measurements of the electron impact electronic excitation cross sections for XF4 (X = C, Si and Ge) molecules at 100 eV, 5° scattering angle and 30 eV, 30° in the electron energy loss range 8.0 - 18 eV. For a target of GeF4 molecule, the optically-forbidden behavior has been observed in the lower electron energy loss range.",

keywords = "SCATTERING, SPECTROSCOPY",

author = "S. Ohtomi and M. Matsui and Y. Mochizuki and A. Suga and H. Kato and M. Hoshino and D. Duflot and P. Lim{\~a}o-Vieira and Hideaki Tanaka",

year = "2015",

month = sep,

day = "7",

doi = "10.1088/1742-6596/635/7/072041",

language = "English",

volume = "Part 1-12",

series = "Journal Of Physics: Conference Series",

publisher = "IOP Publishing Ltd.",

number = "7",

editor = "C. Diaz and I. Rabadan and G. Garcia and L. Mendez and F. Martin",

booktitle = "XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)",

address = "United Kingdom",

note = "29th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015), ICPEAC 2015 ; Conference date: 22-07-2015 Through 28-07-2015",

}

Ohtomi, S, Matsui, M, Mochizuki, Y, Suga, A, Kato, H, Hoshino, M, Duflot, D, Limão-Vieira, P & Tanaka, H 2015, Electronic excitation to low-lying states of GeF₄ molecule by electron impact: A comparative study with CF₄ and SiF₄ molecules. in C Diaz, I Rabadan, G Garcia, L Mendez & F Martin (eds), XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015). vol. Part 1-12, 072041, Journal Of Physics: Conference Series, no. 7, vol. 635, IOP Publishing Ltd., Bristol, UK, 29th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015), Toledo, Spain, 22/07/15. https://doi.org/10.1088/1742-6596/635/7/072041

Electronic excitation to low-lying states of GeF₄ molecule by electron impact : A comparative study with CF₄ and SiF₄ molecules. / Ohtomi, S.; Matsui, M.; Mochizuki, Y.; Suga, A.; Kato, H.; Hoshino, M.; Duflot, D.; Limão-Vieira, P.; Tanaka, Hideaki.

XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015). ed. / C. Diaz; I. Rabadan; G. Garcia; L. Mendez; F. Martin. Vol. Part 1-12 Bristol, UK : IOP Publishing Ltd., 2015. 072041 (Journal Of Physics: Conference Series; Vol. 635, No. 7).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Electronic excitation to low-lying states of GeF4 molecule by electron impact

T2 - 29th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)

AU - Ohtomi, S.

AU - Matsui, M.

AU - Mochizuki, Y.

AU - Suga, A.

AU - Kato, H.

AU - Hoshino, M.

AU - Duflot, D.

AU - Limão-Vieira, P.

AU - Tanaka, Hideaki

N1 - Conference code: 29th

PY - 2015/9/7

Y1 - 2015/9/7

N2 - We report on the measurements of the electron impact electronic excitation cross sections for XF4 (X = C, Si and Ge) molecules at 100 eV, 5° scattering angle and 30 eV, 30° in the electron energy loss range 8.0 - 18 eV. For a target of GeF4 molecule, the optically-forbidden behavior has been observed in the lower electron energy loss range.

AB - We report on the measurements of the electron impact electronic excitation cross sections for XF4 (X = C, Si and Ge) molecules at 100 eV, 5° scattering angle and 30 eV, 30° in the electron energy loss range 8.0 - 18 eV. For a target of GeF4 molecule, the optically-forbidden behavior has been observed in the lower electron energy loss range.

KW - SCATTERING

KW - SPECTROSCOPY

UR - http://www.scopus.com/inward/record.url?scp=84948844657&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/635/7/072041

DO - 10.1088/1742-6596/635/7/072041

M3 - Conference contribution

AN - SCOPUS:84948844657

VL - Part 1-12

T3 - Journal Of Physics: Conference Series

BT - XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)

A2 - Diaz, C.

A2 - Rabadan, I.

A2 - Garcia, G.

A2 - Mendez, L.

A2 - Martin, F.

PB - IOP Publishing Ltd.

CY - Bristol, UK

Y2 - 22 July 2015 through 28 July 2015

ER -

Ohtomi S, Matsui M, Mochizuki Y, Suga A, Kato H, Hoshino M et al. Electronic excitation to low-lying states of GeF₄ molecule by electron impact: A comparative study with CF₄ and SiF₄ molecules. In Diaz C, Rabadan I, Garcia G, Mendez L, Martin F, editors, XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015). Vol. Part 1-12. Bristol, UK: IOP Publishing Ltd. 2015. 072041. (Journal Of Physics: Conference Series; 7). https://doi.org/10.1088/1742-6596/635/7/072041