Electronic excitation to low-lying states of GeF4 molecule by electron impact

A comparative study with CF4 and SiF4 molecules

S. Ohtomi, M. Matsui, Y. Mochizuki, A. Suga, H. Kato, M. Hoshino, D. Duflot, P. Limão-Vieira, Hideaki Tanaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

We report on the measurements of the electron impact electronic excitation cross sections for XF4 (X = C, Si and Ge) molecules at 100 eV, 5° scattering angle and 30 eV, 30° in the electron energy loss range 8.0 - 18 eV. For a target of GeF4 molecule, the optically-forbidden behavior has been observed in the lower electron energy loss range.

Original languageEnglish
Title of host publicationXXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)
EditorsC. Diaz, I. Rabadan, G. Garcia, L. Mendez, F. Martin
Place of PublicationBristol, UK
PublisherIOP Publishing Ltd.
VolumePart 1-12
DOIs
Publication statusPublished - 7 Sep 2015
Event29th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015) - Toledo, Spain
Duration: 22 Jul 201528 Jul 2015
Conference number: 29th

Publication series

NameJournal Of Physics: Conference Series
PublisherIOP Publishing Ltd.
Number7
Volume635
ISSN (Print)1742-6588

Conference

Conference29th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015)
Abbreviated titleICPEAC 2015
CountrySpain
CityToledo
Period22/07/1528/07/15

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Keywords

  • SCATTERING
  • SPECTROSCOPY

Cite this

Ohtomi, S., Matsui, M., Mochizuki, Y., Suga, A., Kato, H., Hoshino, M., ... Tanaka, H. (2015). Electronic excitation to low-lying states of GeF4 molecule by electron impact: A comparative study with CF4 and SiF4 molecules. In C. Diaz, I. Rabadan, G. Garcia, L. Mendez, & F. Martin (Eds.), XXIX International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2015) (Vol. Part 1-12). [072041] (Journal Of Physics: Conference Series; Vol. 635, No. 7). Bristol, UK: IOP Publishing Ltd.. https://doi.org/10.1088/1742-6596/635/7/072041