Electronic excitation of tetrafluoroethylene, C2F4

S. Eden, Paulo Manuel Assis Loureiro Limão-vieira, P. A. Kendall, Nigel J. Mason, J. Delwiche, M. J. Hubin-Franskin, Takahiro Tanaka, Masashi Kitajima, Hiroshi Tanaka, Hyuck Cho

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

The VUV photoabsorption spectrum of tetrafluoroethylene is reported in the wavelength range; 115-320 nm (10.8-3.9 eV). The result is compared with high-energy electron energy loss spectra (EELS). Electrons of incident energy 100 and 30 eV are analysed post-interaction at scattering angles of 5°, 15° and 30° in the energy loss range; 3.0-15.7 eV. Both the photoabsorption and EELS measurements represent the highest resolution data yet reported. The spectra are found to be in good agreement with each other and generally consistent with previous experimental and theoretical work. New photoabsorption features are observed and Rydberg and vibrational assignments suggested. The He(I) photoelectron spectrum is recorded from 9.7 to 20.9 eV and compared to earlier work. New vibrational structure is observed in the first photoelectron band. Implications relevant to the production of CF2 radicals by photon and electron impact are discussed.
Original languageEnglish
Pages (from-to)257-269
Number of pages13
JournalChemical Physics
Volume297
Issue number1-3
DOIs
Publication statusPublished - 16 Feb 2004

Keywords

  • Synchrotron radiation
  • Tetrafluoroethylene
  • C2F4
  • Electron energy loss spectroscopy
  • Electronic and vibrational excitation
  • Photoabsorption
  • Photoelectron spectroscopy
  • Rydberg series

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