Abstract
In this paper, we report on total electron tetrahydrofuran (C4H8O) scattering cross-section measurements for energies in the range from 50 to 5000 eV with experimental errors of about 5%. In addition, integral elastic and inelastic cross sections have been calculated over a broad energy range (1-10 000 eV), with an optical potential method assuming a screening-corrected independent atom representation. Partial and total ionization cross sections have been also obtained by combining simultaneous electron and ion measurements with a time-of-flight analysis of the ionic induced fragmentation. Finally, an average energy distribution of secondary electrons has been derived from these measurements in order to provide data for modeling electron-induced damage in biomolecular systems.
| Original language | Unknown |
|---|---|
| Pages (from-to) | 952709 |
| Journal | Physical Review A |
| Volume | 80 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 1 Jan 2009 |
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