Abstract
RF-PECVD was used to prepare amorphous of carbon (DLC) onto stainless steel 316 and glass substrates. The substrates were negatively biased at between 100 V to 400 V. Thin films of DLC have been deposited using C 2H 2 and titanium isopropoxide (TIPOT). Argon was used to generate the plasma in the PECVD system chamber. DEKTAK 8 surface stylus profilometer was used to measure the film thickness and the deposition rate was calculated. Micro Raman spectroscopy was employed to determine the chemical structure and bonding present in the films. Composition analysis of the samples was carried out using VGTOF SIMS (IX23LS) instrument. In addition, X-ray photoelectron spectroscopy (XPS) was used to analyze the composition and chemical state of the films. The wettability of the films was examined using the optical contact angle meter (CAM200) system. Two types of liquids with different polarities were used to study changes in the surface energy. The as-grown films were in the thickness range of 200-400 nm. Raman spectroscopy results showed that the I D/I G ratio decreased when the bias voltage on the stainless steel substrates was increased. This indicates an increase in the graphitic nature of the film deposited. In contrast, on the glass substrates the I D/I G ratio increased when the bias voltage was increased indicates a greater degree of diamond like character. Chemical composition determined using XPS showed the presence of carbon and oxygen in both samples on glass and stainless steel substrates. Both coatings the contact angle of the films decreased except for 400 V which showed a slight increase. The oxygen is thought to play an important role on the polar component of a-C.
Original language | English |
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Pages (from-to) | 2552-2557 |
Number of pages | 6 |
Journal | Journal of Nanoscience and Nanotechnology |
Volume | 10 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1 Apr 2010 |
Event | 2nd International Conference on Advanced Nano Materials - Universidade de Aveiro, Aveiro, Portugal Duration: 23 Jun 2008 → 25 Jun 2008 |
Keywords
- Chemical vapour deposition (CVD)
- Contact angle
- Diamond like carbon (DLC)
- Raman spectroscopy
- SIMS