Effect of the tunnelling oxide growth by H2O2 oxidation on the performance of a-Si : H MIS photodiodes

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Abstract

In this work metal-insulator-semiconductor (MIS) photodiodes with a structure: Cr/a-Si:H(n(+))/a-Si:H(i)/oxide/Au were studied, where the main objective was to determine the influence of the oxide layer on the performance of the devices. The results achieved show that their performance is a function of both oxide thickness and oxide density. The a-Si:H oxidation method used was the immersion in H2O2 solution. By knowledge of the oxide growth process it was possible to fabricate photodiodes exhibiting an open circuit voltage of 0.65 V and short circuit current density under AM1.5 illumination of 11 mA/cm(2), with a response times less than 1 mus for load resistance <400 Omega, and a signal to noise ratio of 1 x 10(7). (C) 2003 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)256-259
Number of pages4
JournalMaterials Science And Engineering B-Advanced Functional Solid-State Materials
Volume109
Issue number1-3
DOIs
Publication statusPublished - 15 Jun 2004

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