Abstract
In this paper we report results concerning the effect of the TCO interface on hydrogenated amorphous silicon (a-Si:H) p-i-n homojunction solar cells. Its correlation with dark current density-voltage (J-V) characteristics and spectral response, before and after while light-soaking degradation, is analysed. From this study, we conclude that the properties and stability of these devices are not only influenced by the a-Si:H film properties, but also by the properties of the transparent conductive electrode and its interface with the a-Si:H layer.
| Original language | English |
|---|---|
| Pages (from-to) | 646-649 |
| Number of pages | 4 |
| Journal | Proceedings of the IEEE |
| Volume | 1 |
| Publication status | Published - 1994 |
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