Abstract
The dielectric breakdown of thin films of low-density polyethylene (LDPE) electrically aged in an aqueous solution of NaCl under an AC electric field was investigated. A two-parameter Weibull function was used for the dielectric breakdown time to failure. The probability of failure for a sample was obtained by the White method for progressively censored data. Samples aged at different temperatures were compared. The results show that initially the samples aged at lower temperature (≈25°C) are more prone to fail, while those aged at higher temperature (50°C) fail at longer times. This was attributed to a competition between oxidation and diffusion.
Original language | English |
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Pages (from-to) | 602-606 |
Number of pages | 5 |
Journal | Materials Science Forum |
Volume | 455-456 |
Publication status | Published - 29 Jul 2004 |
Event | 2nd International Materials Symposium - Caparica, Portugal Duration: 14 Apr 2003 → 16 Apr 2003 |
Keywords
- Dielectric breakdown
- Polyethylene
- Power cables
- Weibull function