Depth Profiling Barium on Ag(111)

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII
EditorsA. Benninghoven, P. Bertrand, H. N. Migeon, H. W. Werner
Place of PublicationAmsterdam
PublisherElsevier
Pages373-376
ISBN (Print)0444503234, 978-0444503237
Publication statusPublished - 2000
Event12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII - Brussels, Belgium
Duration: 5 Sep 199911 Sep 1999

Conference

Conference12th International Conference on Secondary Ion Mass Spectrometry, SIMS XII
CountryBelgium
CityBrussels
Period5/09/9911/09/99

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