Cross sections for electron scattering from thiophene for a broad energy range

Alexandra Loupas; Ana I. Lozano; Francisco Blanco; Jimena D. Gorfinkiel; Gustavo García

doi:10.1063/1.5040352

Cross sections for electron scattering from thiophene for a broad energy range

Alexandra Loupas, Ana I. Lozano, Francisco Blanco, Jimena D. Gorfinkiel, Gustavo García

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

We present cross sections for elastic and inelastic electron scattering from thiophene calculated in the energy range 0.1-1000 eV. The R-matrix and independent atom representation-screening-corrected additivity rule (IAM-SCAR) methods were used for low-energy and intermediate and high scattering energies, respectively. The results provide a consistent picture of the scattering process in the whole energy range. The effect of including an interference term in the IAM-SCAR approach is considered. Agreement with prior theoretical results is also discussed.

Original language	English
Article number	034304
Number of pages	9
Journal	Journal of Chemical Physics
Volume	149
Issue number	3
DOIs	https://doi.org/10.1063/1.5040352
Publication status	Published - 21 Jul 2018

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10.1063/1.5040352

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@article{a0e1d8b8280941a8afc74532c0ae258c,

title = "Cross sections for electron scattering from thiophene for a broad energy range",

abstract = "We present cross sections for elastic and inelastic electron scattering from thiophene calculated in the energy range 0.1-1000 eV. The R-matrix and independent atom representation-screening-corrected additivity rule (IAM-SCAR) methods were used for low-energy and intermediate and high scattering energies, respectively. The results provide a consistent picture of the scattering process in the whole energy range. The effect of including an interference term in the IAM-SCAR approach is considered. Agreement with prior theoretical results is also discussed.",

author = "Alexandra Loupas and Lozano, \{Ana I.\} and Francisco Blanco and Gorfinkiel, \{Jimena D.\} and Gustavo Garc{\'i}a",

note = "Funding Information: We are grateful to Dr. Romarly da Costa for providing us the numerical data for the SMCPP cross sections. This work was supported by Fundac¸{\~a}o para a Ci{\^e}ncia e a Tecnologia (FCT-MCTES), Radiation Biology and Biophysics Doctoral Training Programme (RaBBiT, PD/00193/2012); UID/Multi/04378/2013 (UCIBIO); UID/FIS/00068/2013 (CEFITEC); and scholarship Grant No. SFRH/BD/106031/2015 to A. Loupas. J.D.G. was supported by EPSRC Grant No. EP/P022146/1. F.B. and G.G. acknowledge partial financial support from the Spanish Ministry MINECO (Project No. FIS2016-80440). A.I.L. is registered on the doctoral of the UNED university. Publisher Copyright: {\textcopyright} 2018 Author(s).",

year = "2018",

month = jul,

day = "21",

doi = "10.1063/1.5040352",

language = "English",

volume = "149",

journal = "Journal of Chemical Physics",

issn = "0021-9606",

publisher = "AIP - American Institute of Physics",

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TY - JOUR

T1 - Cross sections for electron scattering from thiophene for a broad energy range

AU - Loupas, Alexandra

AU - Lozano, Ana I.

AU - Blanco, Francisco

AU - Gorfinkiel, Jimena D.

AU - García, Gustavo

N1 - Funding Information: We are grateful to Dr. Romarly da Costa for providing us the numerical data for the SMCPP cross sections. This work was supported by Fundac¸ão para a Ciência e a Tecnologia (FCT-MCTES), Radiation Biology and Biophysics Doctoral Training Programme (RaBBiT, PD/00193/2012); UID/Multi/04378/2013 (UCIBIO); UID/FIS/00068/2013 (CEFITEC); and scholarship Grant No. SFRH/BD/106031/2015 to A. Loupas. J.D.G. was supported by EPSRC Grant No. EP/P022146/1. F.B. and G.G. acknowledge partial financial support from the Spanish Ministry MINECO (Project No. FIS2016-80440). A.I.L. is registered on the doctoral of the UNED university. Publisher Copyright: © 2018 Author(s).

PY - 2018/7/21

Y1 - 2018/7/21

N2 - We present cross sections for elastic and inelastic electron scattering from thiophene calculated in the energy range 0.1-1000 eV. The R-matrix and independent atom representation-screening-corrected additivity rule (IAM-SCAR) methods were used for low-energy and intermediate and high scattering energies, respectively. The results provide a consistent picture of the scattering process in the whole energy range. The effect of including an interference term in the IAM-SCAR approach is considered. Agreement with prior theoretical results is also discussed.

AB - We present cross sections for elastic and inelastic electron scattering from thiophene calculated in the energy range 0.1-1000 eV. The R-matrix and independent atom representation-screening-corrected additivity rule (IAM-SCAR) methods were used for low-energy and intermediate and high scattering energies, respectively. The results provide a consistent picture of the scattering process in the whole energy range. The effect of including an interference term in the IAM-SCAR approach is considered. Agreement with prior theoretical results is also discussed.

UR - https://www.scopus.com/pages/publications/85050189973

U2 - 10.1063/1.5040352

DO - 10.1063/1.5040352

M3 - Article

C2 - 30037248

AN - SCOPUS:85050189973

SN - 0021-9606

VL - 149

JO - Journal of Chemical Physics

JF - Journal of Chemical Physics

IS - 3

M1 - 034304

ER -

Cross sections for electron scattering from thiophene for a broad energy range

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